EMAS 2023
17th European Workshop on
Modern Developments and Applications in Microbeam Analysis

 7th - 11th May 2023
Jagiellonian University, Auditorium Maximum, Krakow, Poland

Exploring the limits of low voltage EPMA of coated samples,  Michael B. MATTHEWS  (AWE Plc., Reading, Great Britain)  ppt;  doc

BadgerFilm: A new thin film analysis programme for EPMA,  Aurelien MOY  (University of Wisconsin, Department of Geoscience, Madison, WI, U.S.A.)  ppt;  doc

Soft X-ray EPMA - Choosing the right MACs,  Xavier LLOVET  (University of Barcelona, Scientific and Technological Centers (CCiT), Barcelona, Spain)  ppt;  doc

Sub-scale inversion of X-ray emission in electron probe microanalysis based on deterministic transport equations,  Manuel TORRILHON  (R.W.T.H. Aachen, Mathematics Division, Center for Computational Engineering Science, Aachen, Germany)  ppt;  doc

In-situ EBSD observations of martensitic phase transformation and recrystallization process,  Robert CHULIST  (Polish Academy of Sciences, Alek. Krupkowski Institute of Metallurgy and Materials Science, Krakow, Poland)  doc

Developments and applications in transmission Kikuchi diffraction,  Tomasz TOKARSKI  (AGH - University of Science and Technology, Academic Centre for Materials and Nanotechnology, Krakow, Poland)  ppt;  doc

Local, absolute residual strain measurements using combined ring-core milling and cross correlation EBSD in an SEM,  Stefan ZAEFFERER  (Max-Planck Institut für Eisenforschung GmbH, Diffraction and Microscopy Group, Düsseldorf, Germany)  ppt;  doc

Almost 100 years of X-ray Kossel diffraction and its advantages versus the exclusive application of EBSD: From the prediction to current developments,  Enrico LANGER  (Technical University of Dresden, Institute of Solid State and Materials Physics, Dresden, Germany)  doc

HyperSpy: An open source multi-dimensional analysis software for electron microscopy,  Håkon Wiik ÅNES  (Norwegian University of Science and Technology (NTNU), Dept. Materials Science and Engineering, Trondheim, Norway)  ppt;  doc

Machine learning techniques in the microscopic characterisation of nanomaterials,  Benedykt R. JANY  (Jagiellonian University, Institute of Physics, Krakow, Poland)  ppt;  doc

Focussed beams for use in EBSD,  Bartlomiej (Bart) WINIARSKI  (Thermo Fisher Scientific, Brno, Czech Republic & The Royce Institute for Advanced Materials, Manchester, Great Britain)  ppt;  doc

Recognising and avoiding ion beam induced sample damage and artefacts where it matters: FIB processing of thermally low conductive materials and FIB EBDS sample preparation,  Annalena WOLFF  (California Institute of Technology (CALTECH), The Kavli Nanoscience Institute, Pasadena, CA, U.S.A.)  doc

4D-STEM/PNBD: Fast and easy powder electron diffraction in SEM,  Miroslav SLOUF  (Czech Academy of Sciences, Institute of Macromolecular Chemistry, Prague, Czech Republic)  doc

FIB-ToF-SIMS - Recent advances in secondary ion mass spectrometry for analytical dual beam focussed ion beam instruments,  Johann MICHLER  (Swiss Federal Laboratories for Materials Testing and Research, Laboratory for Mechanics of Materials and Nanostructures, Thun, Switzerland)  doc

Coupled SEM-EDS-Raman : A complementary approach for characterisation - Application to geomaterials,  Guillaume WILLE  (BRGM - Bureau de Recherches Géologiques et Minières, LAB/MIN, Orléans, France)  doc

STEM-CL and related spectrocopies using a high numerical aperture mirror,  Mathieu KOCIAK  (Université Paris-Sud, Laboratoire de Physique des Solides, Orsay Cedex, France)  doc

EMAS 2026
15th Regional Workshop:
Topical Conference on Electron Backscatter Diffraction

14th - 17th June 2026
CentraleSupélec, Gif-sur-Yvette, France

EBSD - an historical point of view  François Brisset  (CNRS, Université Paris Saclay, Institut de Chimie Moléculaire et des Matériaux d'Orsay, Orsay, and CentraleSupélec, Gif-sur-Yvette, France)  doc

Sample preparation for EBSD, Grzegorz Cios   (AGH University of Krakow, Academic Centre for Materials and Nanotechnology, Krakow, Poland)  doc

Basic crystallography and diffraction for EBSD,  René de Kloe  (Ametek BV, EDAX/Gatan Business Unit, Tilburg, The Netherlands)  doc

Good practice for grains size measurement and post processing,  Patrick Villechaise  (CNRS - Université de Poitiers - ISAE-ENSMA, UPR 3346, Institut Pprime, Physics and Mechanics of Materials, Futuroscope Cedex, France)  doc

Orientation representation,  Stuart I. Wright  (Ametek, Inc., GATAN + EDAX Business Unit, Pleasanton, CA, U.S.A.)  doc

EBSD in Geosciences: Examples of three developments in three decades,  John Wheeler  (Liverpool University, School of Environmental Sciences, Department of Earth, Ocean and Ecological Sciences, Liverpool, U.K.)  doc

The increasing multi-functionality of high-resolution EBSD,  Qiwei Shi  (SJTU Paris Elite Institute of Technology, Shanghai Jiao Tong University, Shanghai, P.R. China)  doc

Electron channelling contrast imaging (ECCI),  Nathalie Gey  (Université de Lorraine, Laboratoire d’Étude des Microstructures et de Mécanique des Matériaux, Metz, France)  doc

3D orientation microscopy (3D-EBSD),  Peter J. Konijnenberg  (Max-Planck Institute for Sustainable Materials, Diffraction and Microscopy Group, Düsseldorf, Germany)  doc

Transmission Kikuchi diffraction in practice: Principles, challenges and emerging opportunities,  Alice Bastos da Silva Fanta  (Technical University of Denmark, Microstructural Analysis of Materials Processes in the SEM, Kgs. Lyngby, Denmark)  doc

EMAS 2025
18th European Workshop on
Modern Developments and Applications in Microbeam Analysis

11th - 15th May 2025
TechnoCampus, Mataró (Barcelona), Spain

Spherical indexing of electron backscatter diffraction patterns,  René DE KLOE  (Ametek BV, EDAX/Gatan Business Unit, Tilburg, The Netherlands)  ppt

Towards absolute local stress measurements through non-simulation-based high angular resolution EBSD,  Tijmen VERMEIJ  (Empa - Swiss Federal Labs. Materials Science and Technology, Thun, Switzerland)  doc

ETSPY: A HYPERSPY extension package for conventional and spectroscopic tomography,  Andrew A. HERZING  (National Institute of Standards and Technology, Material Measurement Laboratory, Gaithersburg, MD, U.S.A.)  doc

Automated in situ EBSD experiments: Capabilities and considerations,  Jack M. DONOGHUE  (The University of Manchester, Dept. Materials, Henry Royce Institute, Manchester, Great Britain)  doc

Pixels, patterns, pseudosymmetries: On resolution limits of EBSD,  Aimo WINKELMANN  (AGH - University of Krakow, Academic Centre for Materials and Nanotechnology, Krakow, Poland)  doc

Development of correlated FIB-ToF-SIMS and SEM-AM methods for the search for, and characterisation of, enriched uranium particles,  William D.A. RICKARD  (Curtin University of Adelaide, Advanced Resource Characterisation Facility, Perth, WA, Australia)  doc

Towards standardisation of average grain size measurement of additively manufactured microstructures using EBSD,  Vivian TONG (National Physical Laboratory, Teddington, Great Britain)  doc

Quality control of quantitative microanalysis and reference materials,  Emma S. BULLOCK  (Carnegie Institution for Science, Earth and Planets Laboratory, Washington D.C., U.S.A.)  ppt;  doc

Nanomineralogy – planetary materials,  Martin R. LEE  (University of Glasgow, School of Geographical and Earth Sciences, Glasgow, Great Britain)  doc

Nanomineralogy applied to high-tech critical metal ore research,  José María GONZÁLEZ-JIMÉNEZ  (CSIC - Universidad de Granada, Instituto Andaluz de Ciencias de la Tierra, Armilla, Granada, Spain)  doc

Development and application of soft X-ray spectroscopy and cathodoluminescence,  Colin M. MACRAE  (C.S.I.R.O. Mineral Resources, Microbeam Laboratory, Clayton South, VIC, Australia)  doc

Spectroscopy, electronic structure and quantification attempt in the spectral range of the Li Kα emission band,  Philippe JONNARD  (Université Pierre et Marie Curie – Paris 6, Lab. de Chimie Physique-Matière et Rayonnement, Paris, France)  ppt;  doc

Quantitative mapping of nitrogen in Ti-6Al-4V: Application of SXES, EDS and WDS,  Jon W. FELLOWES  (The University of Manchester, Department of Earth and Environmental Sciences, Manchester, Great Britain)  doc

Combined EDS and WDS quantitative analyses: The best of both worlds,  Julien M. ALLAZ  (ETH Zürich, Department of Earth and Planetary Sciences, Zürich, Switzerland)  doc

Latest developments of the soft X-ray emission spectrometer,  Shogo KOSHIYA  (JEOL Ltd., Akishima, Japan)  docSoft X-ray self-absorption structure analysis,  Takaomi YOKOYAMA  (JEOL Ltd., Akishima, Japan)  doc

Combining nanoCT and electron microscopy for scale-bridging 3D analysis of nanoparticulate and porous functional materials,  Erdmann SPIECKER  (Friedrich-Alexander-Universität Erlangen Nürnberg, Interdisziplinäres Zentrum für Nanostrukturierte Filme (IZNF), Erlangen, Germany)  doc

Iconic instruments for art: Combined analysis techniques in cultural heritage,  Michele GIRONDA  (XGLab S.r.l., Milan, Italy)  doc

Possibilities and limitations of Li-detection and quantification in electron beam analysis,  Ute GOLLA‑SCHINDLER  (Aalen University, Materials Research Institute (IMFAA), Aalen, Germany)  doc

Correlated mechanical microscopy using nanoindentation, EDS, and EBSD mapping on a Seymchan meteorite fragment,  Jeff WHEELER  (Oxford Instruments - FemtoTools AG, Buchs, Switzerland)  doc

EMAS 2024
14th Regional Workshop on
The Edge of New EM and Microanalysis Technology

12th - 15th May 2024
Brno University of Technology, Brno, Czech Republic

Introduction to SEM,  Ivo Kuběna (Czech Academy of Sciences, Institute of Physics of Materials, Brno, Czech Republic)  doc

Introduction to TEM,  Mariana Klementová  (Czech Academy of Sciences, Institute of Physics, Prague, Czech Republic)  doc

Introduction to FIB-SEMs,  Michal Urbánek  (Brno University of Technology, Central European Institute of Technology (CEITEC), Brno, Czech Republic)  doc

Overview of microanalytical techniques,  Ondřej Man  (Brno University of Technology, Central European Institute of Technology (CEITEC), Nano Research Infrastructure, Structural Analysis Laboratory, Brno, Czech Republic)  doc

Sample preparation for SEM, microanalysis and EBSD,  Grzegorz Cios  (AGH - University of Science and Technology, Academic Centre for Materials and Nanotechnology, Krakow, Poland)  doc

In-situ experiments in SEM/TEM - overview,  Miroslav Kolíbal  (Brno University of Technology, Central European Institute of Technology (CEITEC), Brno, Czech Republic)  doc

Seamless 4D-STEM workflows for the characterisation of materials and nanoscale devices,  Daniel Němeček  (TESCAN Group a.s., Brno, Czech Republic)  doc

Multi beam SEM (mSEM): Extreme large 2D and 3D nanoscale application,  Antonio Casares  (Carl Zeiss AG, Oberkochen, Germany)  doc

Accelerating microanalysis in SEM using the backscattered electron and X ray (BEX) technique,  Philippe T. Pinard  (Oxford Instruments NanoAnalysis Ltd., High Wycombe, Great Britain)  doc

Latest development on direct‐detect EBSD cameras and spherical indexing,  René de Kloe  (Ametek BV, EDAX/Gatan Business Unit, Tilburg, The Netherlands)  doc

New developments in detecting low-energy X-rays using SXES,  Georg Raggl  (JEOL (Germany) GmbH, Freising, Germany)  doc

SEM-XRF: Full range EDS data on large and irregular samples,  Andrew Menzies  (Bruker Nano GmbH, Analytics Division, Berlin, Germany)  doc

LVEM: contrast-enhancing technology for applications from 0D to 3D materials,  Jaromír Bačovský  (Delong Instruments a.s., Brno, Czech Republic)  doc

Application of EM in steel research,  Šárka Mikmeková  (Czech Academy of Sciences, Institute of Scientific Instruments, Brno, Czech Republic) doc

Application of EM in mineralogy/geology,  Iris Buisman  (University of Cambridge, Department of Earth Sciences, Cambridge, Great Britain)  doc

Correlative and multi-scale analyses of advanced materials,  Bartlomiej (Bart) Winiarski  (Thermo Fisher Scientific, Brno, Czech Republic & The Royce Institute for Advanced Materials, Manchester, Great Britain)  doc

4D-STEM powder diffraction in SEM,  Miroslav Šlouf  (Czech Academy of Sciences, Institute of Macromolecular Chemistry, Prague, Czech Republic)  doc