EMAS 2026
15th Regional Workshop:
Topical Conference on Electron Backscatter Diffraction

14th - 17th June 2026
CentraleSupélec, Gif-sur-Yvette, France

EBSD - an historical point of view  François Brisset  (CNRS, Université Paris Saclay, Institut de Chimie Moléculaire et des Matériaux d'Orsay, Orsay, and CentraleSupélec, Gif-sur-Yvette, France)  doc

Sample preparation for EBSD, Grzegorz Cios   (AGH University of Krakow, Academic Centre for Materials and Nanotechnology, Krakow, Poland)  doc

Basic crystallography and diffraction for EBSD,  René de Kloe  (Ametek BV, EDAX/Gatan Business Unit, Tilburg, The Netherlands)  doc

Good practice for grains size measurement and post processing,  Patrick Villechaise  (CNRS - Université de Poitiers - ISAE-ENSMA, UPR 3346, Institut Pprime, Physics and Mechanics of Materials, Futuroscope Cedex, France)  doc

Orientation representation,  Stuart I. Wright  (Ametek, Inc., GATAN + EDAX Business Unit, Pleasanton, CA, U.S.A.)  doc

EBSD in Geosciences: Examples of three developments in three decades,  John Wheeler  (Liverpool University, School of Environmental Sciences, Department of Earth, Ocean and Ecological Sciences, Liverpool, U.K.)  doc

The increasing multi-functionality of high-resolution EBSD,  Qiwei Shi  (SJTU Paris Elite Institute of Technology, Shanghai Jiao Tong University, Shanghai, P.R. China)  doc

Electron channelling contrast imaging (ECCI),  Nathalie Gey  (Université de Lorraine, Laboratoire d’Étude des Microstructures et de Mécanique des Matériaux, Metz, France)  doc

3D orientation microscopy (3D-EBSD),  Peter J. Konijnenberg  (Max-Planck Institute for Sustainable Materials, Diffraction and Microscopy Group, Düsseldorf, Germany)  doc

Transmission Kikuchi diffraction in practice: Principles, challenges and emerging opportunities,  Alice Bastos da Silva Fanta  (Technical University of Denmark, Microstructural Analysis of Materials Processes in the SEM, Kgs. Lyngby, Denmark)  doc

EMAS 2025
18th European Workshop on
Modern Developments and Applications in Microbeam Analysis

11th - 15th May 2025
TechnoCampus, Mataró (Barcelona), Spain

Spherical indexing of electron backscatter diffraction patterns,  René DE KLOE  (Ametek BV, EDAX/Gatan Business Unit, Tilburg, The Netherlands)  ppt

Towards absolute local stress measurements through non-simulation-based high angular resolution EBSD,  Tijmen VERMEIJ  (Empa - Swiss Federal Labs. Materials Science and Technology, Thun, Switzerland)  doc

ETSPY: A HYPERSPY extension package for conventional and spectroscopic tomography,  Andrew A. HERZING  (National Institute of Standards and Technology, Material Measurement Laboratory, Gaithersburg, MD, U.S.A.)  doc

Automated in situ EBSD experiments: Capabilities and considerations,  Jack M. DONOGHUE  (The University of Manchester, Dept. Materials, Henry Royce Institute, Manchester, Great Britain)  doc

Pixels, patterns, pseudosymmetries: On resolution limits of EBSD,  Aimo WINKELMANN  (AGH - University of Krakow, Academic Centre for Materials and Nanotechnology, Krakow, Poland)  doc

Development of correlated FIB-ToF-SIMS and SEM-AM methods for the search for, and characterisation of, enriched uranium particles,  William D.A. RICKARD  (Curtin University of Adelaide, Advanced Resource Characterisation Facility, Perth, WA, Australia)  doc

Towards standardisation of average grain size measurement of additively manufactured microstructures using EBSD,  Vivian TONG (National Physical Laboratory, Teddington, Great Britain)  doc

Quality control of quantitative microanalysis and reference materials,  Emma S. BULLOCK  (Carnegie Institution for Science, Earth and Planets Laboratory, Washington D.C., U.S.A.)  ppt;  doc

Nanomineralogy – planetary materials,  Martin R. LEE  (University of Glasgow, School of Geographical and Earth Sciences, Glasgow, Great Britain)  doc

Nanomineralogy applied to high-tech critical metal ore research,  José María GONZÁLEZ-JIMÉNEZ  (CSIC - Universidad de Granada, Instituto Andaluz de Ciencias de la Tierra, Armilla, Granada, Spain)  doc

Development and application of soft X-ray spectroscopy and cathodoluminescence,  Colin M. MACRAE  (C.S.I.R.O. Mineral Resources, Microbeam Laboratory, Clayton South, VIC, Australia)  doc

Spectroscopy, electronic structure and quantification attempt in the spectral range of the Li Kα emission band,  Philippe JONNARD  (Université Pierre et Marie Curie – Paris 6, Lab. de Chimie Physique-Matière et Rayonnement, Paris, France)  ppt;  doc

Quantitative mapping of nitrogen in Ti-6Al-4V: Application of SXES, EDS and WDS,  Jon W. FELLOWES  (The University of Manchester, Department of Earth and Environmental Sciences, Manchester, Great Britain)  doc

Combined EDS and WDS quantitative analyses: The best of both worlds,  Julien M. ALLAZ  (ETH Zürich, Department of Earth and Planetary Sciences, Zürich, Switzerland)  doc

Latest developments of the soft X-ray emission spectrometer,  Shogo KOSHIYA  (JEOL Ltd., Akishima, Japan)  docSoft X-ray self-absorption structure analysis,  Takaomi YOKOYAMA  (JEOL Ltd., Akishima, Japan)  doc

Combining nanoCT and electron microscopy for scale-bridging 3D analysis of nanoparticulate and porous functional materials,  Erdmann SPIECKER  (Friedrich-Alexander-Universität Erlangen Nürnberg, Interdisziplinäres Zentrum für Nanostrukturierte Filme (IZNF), Erlangen, Germany)  doc

Iconic instruments for art: Combined analysis techniques in cultural heritage,  Michele GIRONDA  (XGLab S.r.l., Milan, Italy)  doc

Possibilities and limitations of Li-detection and quantification in electron beam analysis,  Ute GOLLA‑SCHINDLER  (Aalen University, Materials Research Institute (IMFAA), Aalen, Germany)  doc

Correlated mechanical microscopy using nanoindentation, EDS, and EBSD mapping on a Seymchan meteorite fragment,  Jeff WHEELER  (Oxford Instruments - FemtoTools AG, Buchs, Switzerland)  doc

EMAS 2024
14th Regional Workshop on
The Edge of New EM and Microanalysis Technology

12th - 15th May 2024
Brno University of Technology, Brno, Czech Republic

Introduction to SEM,  Ivo Kuběna (Czech Academy of Sciences, Institute of Physics of Materials, Brno, Czech Republic)  doc

Introduction to TEM,  Mariana Klementová  (Czech Academy of Sciences, Institute of Physics, Prague, Czech Republic)  doc

Introduction to FIB-SEMs,  Michal Urbánek  (Brno University of Technology, Central European Institute of Technology (CEITEC), Brno, Czech Republic)  doc

Overview of microanalytical techniques,  Ondřej Man  (Brno University of Technology, Central European Institute of Technology (CEITEC), Nano Research Infrastructure, Structural Analysis Laboratory, Brno, Czech Republic)  doc

Sample preparation for SEM, microanalysis and EBSD,  Grzegorz Cios  (AGH - University of Science and Technology, Academic Centre for Materials and Nanotechnology, Krakow, Poland)  doc

In-situ experiments in SEM/TEM - overview,  Miroslav Kolíbal  (Brno University of Technology, Central European Institute of Technology (CEITEC), Brno, Czech Republic)  doc

Seamless 4D-STEM workflows for the characterisation of materials and nanoscale devices,  Daniel Němeček  (TESCAN Group a.s., Brno, Czech Republic)  doc

Multi beam SEM (mSEM): Extreme large 2D and 3D nanoscale application,  Antonio Casares  (Carl Zeiss AG, Oberkochen, Germany)  doc

Accelerating microanalysis in SEM using the backscattered electron and X ray (BEX) technique,  Philippe T. Pinard  (Oxford Instruments NanoAnalysis Ltd., High Wycombe, Great Britain)  doc

Latest development on direct‐detect EBSD cameras and spherical indexing,  René de Kloe  (Ametek BV, EDAX/Gatan Business Unit, Tilburg, The Netherlands)  doc

New developments in detecting low-energy X-rays using SXES,  Georg Raggl  (JEOL (Germany) GmbH, Freising, Germany)  doc

SEM-XRF: Full range EDS data on large and irregular samples,  Andrew Menzies  (Bruker Nano GmbH, Analytics Division, Berlin, Germany)  doc

LVEM: contrast-enhancing technology for applications from 0D to 3D materials,  Jaromír Bačovský  (Delong Instruments a.s., Brno, Czech Republic)  doc

Application of EM in steel research,  Šárka Mikmeková  (Czech Academy of Sciences, Institute of Scientific Instruments, Brno, Czech Republic) doc

Application of EM in mineralogy/geology,  Iris Buisman  (University of Cambridge, Department of Earth Sciences, Cambridge, Great Britain)  doc

Correlative and multi-scale analyses of advanced materials,  Bartlomiej (Bart) Winiarski  (Thermo Fisher Scientific, Brno, Czech Republic & The Royce Institute for Advanced Materials, Manchester, Great Britain)  doc

4D-STEM powder diffraction in SEM,  Miroslav Šlouf  (Czech Academy of Sciences, Institute of Macromolecular Chemistry, Prague, Czech Republic)  doc

EMAS 2018
13th Regional Workshop on
Microbeam Analysis in the Earth Sciences

4th - 7th September 2018
University of Bristol, Wills Hall, Bristol, Great Britain

Macro-micro-nanoscale SEM/EDS of earth and planetary materials, Tobias Salge (Natural History Museum, Core Research Laboratories, London, Great Britain)  doc

The application of SEM imaging techniques to the study of rare fossils, Patrick J. ORR (University College Dublin, School of Earth Sciences, Dublin, Ireland)  doc

SEM element mapping: strengths, limitations and applications to petrography of volcanic rocks, Duncan MUIR (University College of Wales, School of Earth and Ocean Sciences, Cardiff, Great Britain)  doc

Electron probe microanalysis (EPMA) in the Earth Sciences, Richard D. WALSHAW (University of Leeds, School of Earth and Environment, Leeds Great Britain)  doc

Analysing silicate melt inclusions, Ery C. HUGHES (University of Bristol, School of Earth Sciences, Bristol, Great Britain)  doc

Trace element analysis of extraterrestrial olivine, Timothy GREGORY (University of Bristol, School of Earth Sciences, Bristol, Great Britain) doc

Transmission electron microscopy: mineralogy at the nanoscale, Martin R. LEE (University of Glasgow, Department of Geographical and Earth Sciences, Glasgow, Great Britain)  doc

Cathodoluminescence in SEM and EPMA – Applications in geology and material sciences, B. Matat JABLON (University of Strathclyde, Department of Physics, Semiconductor Spectroscopy & Devices, Glasgow, Great Britain)  doc

High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological materials, David WALLIS (University of Oxford, Department of Earth Sciences, Oxford, Great Britain)  doc

Isotopic imaging of minerals with NanoSIMS, Matt KILBURN (University of Western Australia, Centre for Microscopy, Characterisation and Analysis (CMCA), Crawley, WA, Australia)  doc

SIMS of synthetic and biological carbonates, Nicola ALLISON (University of St. Andrews, School of Earth and Environmental Sciences, St. Andrews, Great Britain)  doc

Application of secondary ion mass spectrometry (SIMS) to the study of volatiles in melt inclusions, Cees‑Jan DE HOOG (University of Edinburgh, School of Geosciences, Edinburgh, Great Britain)  doc

Laser ablation ICP-MS – From craters to calculations, Jay THOMPSON (University of Oxford, Department of Earth Sciences, Oxford, Great Britain)  doc

Analysis of sulphur concentrations and redox state in silicate glasses, Duane SMYTHE (University of Oxford, Department of Earth Sciences, Oxford, Great Britain)  doc

Detecting diagenesis: ⁸⁷Sr/⁸⁶Sr analysis of archaeological bioapatites by LA MC ICPMS to assess diagenetic uptake of Sr in enamel, Jamie LEWIS (University of Bristol, School of Earth Sciences, Bristol, Great Britain)  doc

Synchrotron µ-X-ray absorption spectroscopy in the Earth Sciences, Tina GERAKI (Diamond Light Source Ltd., Didcot, Great Britain)  doc

Determining the redox state of iron in silicate glasses using XANES, Andrew MATZEN (University of Oxford, Department of Earth Sciences, Oxford, Great Britain)  doc

X-ray tomography analysis and applications of µ-CT techniques for 3D visualisation in palaeobiology, Tom G. DAVIES (University of Bristol, School of Earth Sciences, Bristol, Great Britain)  doc

Chemical and ultrastructural characterisation of pigmented soft tissues in fossil vertebrates and insects, Maria MCNAMARA (University College Cork, School of Biological, Earth & Environmental Sciences, Cork, Ireland)  doc

The use of Raman and micro-ATR (FTIR) spectroscopies to measure volatile species in silicate glasses, Richard BROOKER (University of Bristol, School of Earth Sciences, Bristol, Great Britain)  doc

Atom probe tomography: providing new insights into geological materials, James DOUGLAS (University of Oxford, Department of Materials, Oxford, Great Britain)  doc

Preparation of Earth Science materials for microbeam analysis, Jon WADE (University of Oxford, Department of Earth Sciences, Oxford, Great Britain)  doc

A forward look in applications of high-spatial resolution LA-ICP-MS U Th Pb geochronology, Matthew HORSTWOOD (British Geological Survey, Geochronology and Tracers Facility, Keyworth, Great Britain)  doc

New frontiers in isotope ratio measurement using collision cell, multi collector plasma mass spectrometry, Tim ELLIOTT (University of Bristol, School of Earth Sciences, Bristol, Great Britain)  doc

Quantitative chemical analysis of diamond anvil cell experiments and other tiny samples, Eleonor JENNINGS (University of Bayreuth, Bayerisches Geoinstitut, Bayreuth, Germany)  doc

High spatial resolution analysis of chemical zoning in volcanic crystals, Jon BLUNDY (University of Bristol, School of Earth Sciences, Bristol, Great Britain)  doc