EMAS 201818th European Workshop onModern Developments and Applications in Microbeam Analysis
11th - 15th May 2025TechnoCampus, Mataró (Barcelona), Spain
Spherical indexing of electron backscatter diffraction patterns, René DE KLOE (Ametek BV, EDAX/Gatan Business Unit, Tilburg, The Netherlands) ppt
Towards absolute local stress measurements through non-simulation-based high angular resolution EBSD, Tijmen VERMEIJ (Empa - Swiss Federal Labs. Materials Science and Technology, Thun, Switzerland) doc
ETSPY: A HYPERSPY extension package for conventional and spectroscopic tomography, Andrew A. HERZING (National Institute of Standards and Technology, Material Measurement Laboratory, Gaithersburg, MD, U.S.A.) doc
Automated in situ EBSD experiments: Capabilities and considerations, Jack M. DONOGHUE (The University of Manchester, Dept. Materials, Henry Royce Institute, Manchester, Great Britain) doc
Pixels, patterns, pseudosymmetries: On resolution limits of EBSD, Aimo WINKELMANN (AGH - University of Krakow, Academic Centre for Materials and Nanotechnology, Krakow, Poland) doc
Development of correlated FIB-ToF-SIMS and SEM-AM methods for the search for, and characterisation of, enriched uranium particles, William D.A. RICKARD (Curtin University of Adelaide, Advanced Resource Characterisation Facility, Perth, WA, Australia) doc
Towards standardisation of average grain size measurement of additively manufactured microstructures using EBSD, Vivian TONG (National Physical Laboratory, Teddington, Great Britain) doc
Quality control of quantitative microanalysis and reference materials, Emma S. BULLOCK (Carnegie Institution for Science, Earth and Planets Laboratory, Washington D.C., U.S.A.) ppt; doc
Nanomineralogy – planetary materials, Martin R. LEE (University of Glasgow, School of Geographical and Earth Sciences, Glasgow, Great Britain) doc
Nanomineralogy applied to high-tech critical metal ore research, José María GONZÁLEZ-JIMÉNEZ (CSIC - Universidad de Granada, Instituto Andaluz de Ciencias de la Tierra, Armilla, Granada, Spain) doc
Development and application of soft X-ray spectroscopy and cathodoluminescence, Colin M. MACRAE (C.S.I.R.O. Mineral Resources, Microbeam Laboratory, Clayton South, VIC, Australia) doc
Spectroscopy, electronic structure and quantification attempt in the spectral range of the Li Kα emission band, Philippe JONNARD (Université Pierre et Marie Curie – Paris 6, Lab. de Chimie Physique-Matière et Rayonnement, Paris, France) ppt; doc
Quantitative mapping of nitrogen in Ti-6Al-4V: Application of SXES, EDS and WDS, Jon W. FELLOWES (The University of Manchester, Department of Earth and Environmental Sciences, Manchester, Great Britain) doc
Combined EDS and WDS quantitative analyses: The best of both worlds, Julien M. ALLAZ (ETH Zürich, Department of Earth and Planetary Sciences, Zürich, Switzerland) doc
Latest developments of the soft X-ray emission spectrometer, Shogo KOSHIYA (JEOL Ltd., Akishima, Japan) docSoft X-ray self-absorption structure analysis, Takaomi YOKOYAMA (JEOL Ltd., Akishima, Japan) doc
Combining nanoCT and electron microscopy for scale-bridging 3D analysis of nanoparticulate and porous functional materials, Erdmann SPIECKER (Friedrich-Alexander-Universität Erlangen Nürnberg, Interdisziplinäres Zentrum für Nanostrukturierte Filme (IZNF), Erlangen, Germany) doc
Iconic instruments for art: Combined analysis techniques in cultural heritage, Michele GIRONDA (XGLab S.r.l., Milan, Italy) doc
Possibilities and limitations of Li-detection and quantification in electron beam analysis, Ute GOLLA‑SCHINDLER (Aalen University, Materials Research Institute (IMFAA), Aalen, Germany) doc
Correlated mechanical microscopy using nanoindentation, EDS, and EBSD mapping on a Seymchan meteorite fragment, Jeff WHEELER (Oxford Instruments - FemtoTools AG, Buchs, Switzerland) doc
EMAS 201814th Regional Workshop onThe Edge of New EM and Microanalysis Technology
12th - 15th May 2024Brno University of Technology, Brno, Czech Republic
Introduction to SEM, Ivo Kuběna (Czech Academy of Sciences, Institute of Physics of Materials, Brno, Czech Republic) doc
Introduction to TEM, Mariana Klementová (Czech Academy of Sciences, Institute of Physics, Prague, Czech Republic) doc
Introduction to FIB-SEMs, Michal Urbánek (Brno University of Technology, Central European Institute of Technology (CEITEC), Brno, Czech Republic) doc
Overview of microanalytical techniques, Ondřej Man (Brno University of Technology, Central European Institute of Technology (CEITEC), Nano Research Infrastructure, Structural Analysis Laboratory, Brno, Czech Republic) doc
Sample preparation for SEM, microanalysis and EBSD, Grzegorz Cios (AGH - University of Science and Technology, Academic Centre for Materials and Nanotechnology, Krakow, Poland) doc
In-situ experiments in SEM/TEM - overview, Miroslav Kolíbal (Brno University of Technology, Central European Institute of Technology (CEITEC), Brno, Czech Republic) doc
Seamless 4D-STEM workflows for the characterisation of materials and nanoscale devices, Daniel Němeček (TESCAN Group a.s., Brno, Czech Republic) doc
Multi beam SEM (mSEM): Extreme large 2D and 3D nanoscale application, Antonio Casares (Carl Zeiss AG, Oberkochen, Germany) doc
Accelerating microanalysis in SEM using the backscattered electron and X ray (BEX) technique, Philippe T. Pinard (Oxford Instruments NanoAnalysis Ltd., High Wycombe, Great Britain) doc
Latest development on direct‐detect EBSD cameras and spherical indexing, René de Kloe (Ametek BV, EDAX/Gatan Business Unit, Tilburg, The Netherlands) doc
New developments in detecting low-energy X-rays using SXES, Georg Raggl (JEOL (Germany) GmbH, Freising, Germany) doc
SEM-XRF: Full range EDS data on large and irregular samples, Andrew Menzies (Bruker Nano GmbH, Analytics Division, Berlin, Germany) doc
LVEM: contrast-enhancing technology for applications from 0D to 3D materials, Jaromír Bačovský (Delong Instruments a.s., Brno, Czech Republic) doc
Application of EM in steel research, Šárka Mikmeková (Czech Academy of Sciences, Institute of Scientific Instruments, Brno, Czech Republic) doc
Application of EM in mineralogy/geology, Iris Buisman (University of Cambridge, Department of Earth Sciences, Cambridge, Great Britain) doc
Correlative and multi-scale analyses of advanced materials, Bartlomiej (Bart) Winiarski (Thermo Fisher Scientific, Brno, Czech Republic & The Royce Institute for Advanced Materials, Manchester, Great Britain) doc
4D-STEM powder diffraction in SEM, Miroslav Šlouf (Czech Academy of Sciences, Institute of Macromolecular Chemistry, Prague, Czech Republic) doc
EMAS 201813th Regional Workshop onMicrobeam Analysis in the Earth Sciences
4th - 7th September 2018University of Bristol, Wills Hall, Bristol, Great Britain
Macro-micro-nanoscale SEM/EDS of earth and planetary materials, Tobias Salge (Natural History Museum, Core Research Laboratories, London, Great Britain) doc
The application of SEM imaging techniques to the study of rare fossils, Patrick J. ORR (University College Dublin, School of Earth Sciences, Dublin, Ireland) doc
SEM element mapping: strengths, limitations and applications to petrography of volcanic rocks, Duncan MUIR (University College of Wales, School of Earth and Ocean Sciences, Cardiff, Great Britain) doc
Electron probe microanalysis (EPMA) in the Earth Sciences, Richard D. WALSHAW (University of Leeds, School of Earth and Environment, Leeds Great Britain) doc
Analysing silicate melt inclusions, Ery C. HUGHES (University of Bristol, School of Earth Sciences, Bristol, Great Britain) doc
Trace element analysis of extraterrestrial olivine, Timothy GREGORY (University of Bristol, School of Earth Sciences, Bristol, Great Britain) doc
Transmission electron microscopy: mineralogy at the nanoscale, Martin R. LEE (University of Glasgow, Department of Geographical and Earth Sciences, Glasgow, Great Britain) doc
Cathodoluminescence in SEM and EPMA – Applications in geology and material sciences, B. Matat JABLON (University of Strathclyde, Department of Physics, Semiconductor Spectroscopy & Devices, Glasgow, Great Britain) doc
High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological materials, David WALLIS (University of Oxford, Department of Earth Sciences, Oxford, Great Britain) doc
Isotopic imaging of minerals with NanoSIMS, Matt KILBURN (University of Western Australia, Centre for Microscopy, Characterisation and Analysis (CMCA), Crawley, WA, Australia) doc
SIMS of synthetic and biological carbonates, Nicola ALLISON (University of St. Andrews, School of Earth and Environmental Sciences, St. Andrews, Great Britain) doc
Application of secondary ion mass spectrometry (SIMS) to the study of volatiles in melt inclusions, Cees‑Jan DE HOOG (University of Edinburgh, School of Geosciences, Edinburgh, Great Britain) doc
Laser ablation ICP-MS – From craters to calculations, Jay THOMPSON (University of Oxford, Department of Earth Sciences, Oxford, Great Britain) doc
Analysis of sulphur concentrations and redox state in silicate glasses, Duane SMYTHE (University of Oxford, Department of Earth Sciences, Oxford, Great Britain) doc
Detecting diagenesis: 87Sr/86Sr analysis of archaeological bioapatites by LA MC ICPMS to assess diagenetic uptake of Sr in enamel, Jamie LEWIS (University of Bristol, School of Earth Sciences, Bristol, Great Britain) doc
Synchrotron µ-X-ray absorption spectroscopy in the Earth Sciences, Tina GERAKI (Diamond Light Source Ltd., Didcot, Great Britain) docDetermining the redox state of iron in silicate glasses using XANES, Andrew MATZEN (University of Oxford, Department of Earth Sciences, Oxford, Great Britain) docX-ray tomography analysis and applications of µ-CT techniques for 3D visualisation in palaeobiology, Tom G. DAVIES (University of Bristol, School of Earth Sciences, Bristol, Great Britain) docChemical and ultrastructural characterisation of pigmented soft tissues in fossil vertebrates and insects, Maria MCNAMARA (University College Cork, School of Biological, Earth & Environmental Sciences, Cork, Ireland) docThe use of Raman and micro-ATR (FTIR) spectroscopies to measure volatile species in silicate glasses, Richard BROOKER (University of Bristol, School of Earth Sciences, Bristol, Great Britain) docAtom probe tomography: providing new insights into geological materials, James DOUGLAS (University of Oxford, Department of Materials, Oxford, Great Britain) docPreparation of Earth Science materials for microbeam analysis, Jon WADE (University of Oxford, Department of Earth Sciences, Oxford, Great Britain) docA forward look in applications of high-spatial resolution LA-ICP-MS U Th Pb geochronology, Matthew HORSTWOOD (British Geological Survey, Geochronology and Tracers Facility, Keyworth, Great Britain) docNew frontiers in isotope ratio measurement using collision cell, multi collector plasma mass spectrometry, Tim ELLIOTT (University of Bristol, School of Earth Sciences, Bristol, Great Britain) docQuantitative chemical analysis of diamond anvil cell experiments and other tiny samples, Eleonor JENNINGS (University of Bayreuth, Bayerisches Geoinstitut, Bayreuth, Germany) docHigh spatial resolution analysis of chemical zoning in volcanic crystals, Jon BLUNDY (University of Bristol, School of Earth Sciences, Bristol, Great Britain) doc
EMAS and Thermo Fisher Scientific are proud to announce the Bastin PhD Thesis Award to promote and reward the interest in microbeam analysis and related techniques by young people in the early stages of a scientific or technical career. This award, created officially in 2019, replaces the EMAS Thesis Award.
This award is named after Giel (Guillaume) F. Bastin (1944 - 2015) to honour his tremendous work on developing quantitative capabilities of ultra-light elements on electron microprobes, and for being one of the founding fathers of the European Microbeam Analysis Society (EMAS), which he presided from 2001 to 2005. The Bastin Fund used for this award is financially supported by Thermo Fisher Scientific, yet the scientific works are exclusively and independently evaluated by an ad-hoc committee from the EMAS Board and expert co-opted members of the EMAS community.
The Bastin PhD Thesis award may be presented at the next EMAS European workshop to an author of a PhD-thesis in the field of electron microscopy related microanalysis. To be eligible, an applicant should be a paid-up ‘regular’ member at the time of application (student status is no longer acceptable since the applicant has already obtained their PhD degree). A verification of the applicant’s membership status will be made when the application is received.
Submissions are receivable until 2 years after graduation. If no European EMAS conference has taken place in the last two years, this period is extended until the last submission deadline.
The PhD thesis must have a completion date after the last submission deadline (e.g., September 1st, 2024 23:59 CEST for the 2027 Award).
EMAS Board members are eligible to apply, provided they fulfil the deadlines of the submission and compliance criteria.
Compliance Criteria
Examples of EM-related microanalysis are: Microanalytical systems attached to EPMA (electron probe microanalysis), SEM (scanning electron microscopy) or TEM (transmission electron microscopy) utilising the electron beam as its primary source. Thus, EDS (energy-dispersive X-ray spectroscopy), WDS (wavelength-dispersive X-ray spectroscopy), CL (cathodoluminescence), EBSD (electron backscatter diffraction), TKD (transmission Kikuchi diffraction), etc. Additionally X-ray/electron transport modelling related to any of those microanalysis techniques above.
Ion beam-related analyses (e.g. SIMS (secondary-ion mass spectrometry), TOF-SIMS (time-of-flight secondary-ion mass spectrometry), FIB (focussed ion beam)) and X-ray source microanalysis (XRF, Synchrotron source) are not included and are only possible as a supplement in combination with the examination methods described above.
The Prize
The winning applicant will receive three years complimentary EMAS regular membership and a € 2,500 cash prize. Additionally, the Guillaume F. Bastin Fund will cover all reasonable travel (up to an amount of about €1,500), hotel, and workshop registration costs the award winner is invited for attending the next EMAS European Workshop where they would be offered to give a 25-minute oral presentation with 5 min questions. The presentation at the Workshop is encouraged, but not obligatory. It is within the power of the EMAS Board to award more than one winner in a given period in which case the cash prize will be shared.
Submission Process
Next deadline for submission: 23:59pm (CEST) Tuesday June 30th, 2026. By the application deadline, the candidate must provide EMAS with the following:
A letter from the supervisor is NOT required. The application should be sent via e-mail to the EMAS Secretary () who will collate all submissions and forward the completed list to the Education Officer and the Bastin Fund Trustees immediately after the deadline.
Course Tutors: Silvia Richter (DE), Philippe Pinard (DE), Xavier Llovet (ES), Raynald Gauvin (CAN)
Hostsed by Central Facility for Electron Microscopy, RWTH Aachen University, June 2014
Programme of Workshop (pdf download)
Official Journal of EMASEMAS has adopted Microscopy and Microanalysis (MiMi) as the official journal of the Society in partnership with the Microanalysis Society of America (MAS).https://academic.oup.com/mam