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EMAS 2012 'Book of Tutorials and Abstracts'

60,00 € each

EMAS 2012

10th Regional Workshop on “Electron Probe Microanalysis Today – Practical Aspects”

17 - 20 June 2012, Padua, Italy

Book of Tutorials and Abstracts

Edited by: A.M. Fioretti

Table of Contents

-  Table of contents                                                                                                                         3

-  Foreword                                                                                                                                       5

-  EMAS 2012 Welcome and Opening Address                                                                         7

-  European Microbeam Analysis Society (EMAS):     Executive Board                               9

                                                                                               Sustaining Companies                    13

-  EMAS 2012 International Scientific and Local Organising Committees                         15

-  Workshop programme                                                                                                              17

-  Sponsors                                                                                                                                     21

Principles of electron probe microanalysis                                                                          17

      Introduction to EPMA and SEM.                                                                                           25

       Hans Dijkstra

      Light element analysis  .                                                                                                         35

       Hans Dijkstra

      Introduction to TEM and electron diffraction in the TEM.                                               45

       János Lábár

      X-ray microanalysis and electron energy loss spectroscopy (EELS) in the TEM.                                                                                                                        55

       János Lábár

      Quantification in electron probe microanalysis (including Monte Carlo simulation and thin films).                                                                                                    75

       Xavier Llovet

      Performance characteristics of WDS and EDS detectors.                                                      91

       Michael B. Matthews

      Sample preparation for EPMA (generic).                                                                          121

       Silvia Richter and J. Mayer

EBSD  -  electron backscatter diffraction                                                                           149

    A personal and practical guide to the history, installation, and future of the electron backscattered diffraction (EBSD) system.                                                                 151

       David Mainprice

      Crystal preferred orientation (CPO) development during Newtonian linear viscous flow.                                                                                                    189

       Richard Spiess


      Looking into the earth’s mantle deformation microstructures.                                          199

       Florian Heidelbach

      High resolution EBSD mapping of quartz deformation microstructures.                     209

       Michel Bestmann

      Electron backscatter diffraction: a tool to solve different questions in the steel industry.                                                                                                    223

       Patricia Romano Triguero

      Use of EBSD in steel microstructure assessment - mechanical properties relations in steels.                                                                                                                    231

       Andrea di Schino and G. Porcu

      In-situ EBSD investigation of re-crystallisation in a copper wire.                                243

       François Brisset, A.L. Helbert and T. Baudin

      Combined EBSD and Kossel measurements on ceramic, metallic and superconducting materials.                                                                                                    257

       Enrico Langer and S. Däbritz

      EBSD for analysis of materials in cultural heritage.                                                             271

       Luca Peruzzo

      Analysis of grain orientation in cold crucible continuous casting of photovoltaic silicon.                                                                                         283

       B. Galliena, Th. Duffara, S. Laya and Florence Robaut

      Interactive area analysis with EBSD.                                                                                 293

       René de Kloe

      Novel EBSD-TEM like technique: texture analysis, orientation and phase maps on nanostructured materials.                                                                                           299

       Stavros Nicolopoulos, E.F. Rauch, M. Véron and B. Beausir

      Advances in EBSD hardware and software, enabling efficient low kV analysis for high spatial resolution and beam sensitive materials.                                 313

       Keith Dicks, U. Singh, S. Sitzman and A. Gholinia

Abstracts of the poster presentations                                                                                  327

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