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EMAS 2012
10th Regional Workshop on “Electron Probe Microanalysis Today – Practical Aspects”
17 - 20 June 2012, Padua, Italy
Book of Tutorials and Abstracts
Edited by: A.M. Fioretti
Table of Contents
- Table of contents 3
- Foreword 5
- EMAS 2012 Welcome and Opening Address 7
- European Microbeam Analysis Society (EMAS): Executive Board 9
Sustaining Companies 13
- EMAS 2012 International Scientific and Local Organising Committees 15
- Workshop programme 17
- Sponsors 21
- Principles of electron probe microanalysis 17
Introduction to EPMA and SEM. 25
Hans Dijkstra
Light element analysis . 35
Introduction to TEM and electron diffraction in the TEM. 45
János Lábár
X-ray microanalysis and electron energy loss spectroscopy (EELS) in the TEM. 55
Quantification in electron probe microanalysis (including Monte Carlo simulation and thin films). 75
Xavier Llovet
Performance characteristics of WDS and EDS detectors. 91
Michael B. Matthews
Sample preparation for EPMA (generic). 121
Silvia Richter and J. Mayer
- EBSD - electron backscatter diffraction 149
A personal and practical guide to the history, installation, and future of the electron backscattered diffraction (EBSD) system. 151
David Mainprice
Crystal preferred orientation (CPO) development during Newtonian linear viscous flow. 189
Richard Spiess
Looking into the earth’s mantle deformation microstructures. 199
Florian Heidelbach
High resolution EBSD mapping of quartz deformation microstructures. 209
Michel Bestmann
Electron backscatter diffraction: a tool to solve different questions in the steel industry. 223
Patricia Romano Triguero
Use of EBSD in steel microstructure assessment - mechanical properties relations in steels. 231
Andrea di Schino and G. Porcu
In-situ EBSD investigation of re-crystallisation in a copper wire. 243
François Brisset, A.L. Helbert and T. Baudin
Combined EBSD and Kossel measurements on ceramic, metallic and superconducting materials. 257
Enrico Langer and S. Däbritz
EBSD for analysis of materials in cultural heritage. 271
Luca Peruzzo
Analysis of grain orientation in cold crucible continuous casting of photovoltaic silicon. 283
B. Galliena, Th. Duffara, S. Laya and Florence Robaut
Interactive area analysis with EBSD. 293
René de Kloe
Novel EBSD-TEM like technique: texture analysis, orientation and phase maps on nanostructured materials. 299
Stavros Nicolopoulos, E.F. Rauch, M. Véron and B. Beausir
Advances in EBSD hardware and software, enabling efficient low kV analysis for high spatial resolution and beam sensitive materials. 313
Keith Dicks, U. Singh, S. Sitzman and A. Gholinia
- Abstracts of the poster presentations 327
