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PROCEEDINGS OF THE EMAS 2015 EUROPEAN WORKSHOP

14th European Workshop in Portorož, Slovenia
Edited by: X. Llovet, M.B. Matthews, M. Čeh, E. Langer and K. Žagar
IOP Conf. Ser.: Mater. Sci. Eng.  (2016)  109  [doi: 10.1088/1757-899X/109/]

This volume of the IOP Conference Series: Materials Science and Engineering contains papers from the 14th Workshop of the European Microbeam Analysis Society (EMAS) on Modern Developments and Applications in Microbeam Analysis which took place from the 3rd to the 7th of May 2015 in the Grand Hotel Bernardin, Portorož, Slovenia.

The primary aim of this series of workshops is to assess the state-of-the-art and reliability of microbeam analysis techniques. The workshops also provide a forum where students and young scientists starting out on a career in microbeam analysis can meet and discuss with the established experts. The workshops have a unique format comprising invited plenary lectures by internationally recognized experts, poster presentations by the participants and round table discussions on the key topics led by specialists in the field. This workshop was organized in collaboration with the Jožef Stefan Institute and SDM – Slovene Society for Microscopy. The technical programme included the following topics: electron probe microanalysis, STEM and EELS, materials applications, cathodoluminescence and electron backscatter diffraction (EBSD), and their applications.

As at previous workshops there was also a special oral session for young scientists. The best presentation by a young scientist was awarded with an invitation to attend the 2016 Microscopy and Microanalysis meeting at Columbus, Ohio. The prize went to Shirin Kaboli, of the Department of Metals and Materials Engineering of McGill University (Montréal, Canada), for her talk entitled “Electron channelling contrast reconstruction with electron backscattered diffraction”.

The continuing relevance of the EMAS workshops and the high regard in which they are held internationally can be seen from the fact that 71 posters from 16 countries were on display at the meeting and that the participants came from as far away as Japan, Canada, USA, and Australia. A selection of participants with posters was invited to give a short oral presentation of their work in three dedicated sessions. The prize for the best poster was an invitation to participate in the 24th Australian Conference on Microscopy and Microanalysis (ACMM 24) in Melbourne, Australia. The prize was awarded to Aurélien Moy of the University of Montpellier (France) for his poster entitled: “Standardless quantification of heavy metals by electron probe microanalysis”.

This proceedings volume contains the full texts of 9 of the invited plenary lectures and of 12 papers on related topics originating from the posters presented at the workshop. All the papers have been subjected to peer review by a least two referees.

 
Acknowledgements

On behalf of the European Microbeam Analysis Society I would like to thank all the invited speakers, session chairs and members of the discussion panels for making the meeting such a great success. Special thanks go to Miran Čeh and Luc Van’t dack who directed the organisation of the workshop giving freely of their time and talents. As was the case for previous workshops, the EMAS board in corpore was responsible for the scientific programme. The Workshop also included a commercial exhibition where many leading instrument suppliers were represented. Several companies that exhibited provided financial support, either by sponsoring an event or by advertising. Below, in alphabetical order, is a list of exhibiting companies and sponsors of the workshop:
- Ametek GmbH, Edax Business Unit
- Bruker Nano GmbH
- Cameca SA
- European Institute for Transuranium Elements (Germany)
- IfG - Institute for Scientific Instruments
- Jeol (Europe) SAS
- Oxford Instruments NanoAnalysis Ltd.
- SCAN, d.o.o.
- Target-Messtechnik
- Thermo Fisher Scientific BV

Michael B. Matthews
EMAS President

Table of contents (manuscript nos. in bold)

- Measurements of the quantitative lateral analytical resolution at sputtered gold-layers with the FEG-EPMA JEOL JXA‑8530F
       D Berger and J Nissen    012001

- A complementary approach to estimate the internal pressure of fission gas bubbles by SEM-SIMS-EPMA in irradiated nuclear fuels
       C Cagna, I Zacharie-Aubrun, P Bienvenu, L Barrallier, B Michel and J Noirot    012002

- Low voltage EPMA: experiments on a new frontier in microanalysis – analytical lateral resolution
       J Fournelle, H Cathey, , P T Pinard and S Richter    012003

- The role of intergranular chromium carbides on intergranular oxidation of nickel based alloys in pressurized water reactors primary water
       F O M Gaslain, H T Le, C Duhamel, C Guerre and P Laghoutaris    012004

- Electron probe microanalysis of Ni-silicides at low voltage: difficulties and possibilities
       E Heikinheimo, P T Pinard, S Richter, X Llovet and S Louhenkilpi    012005

- Characterisation of nanoparticles by means of high-resolution SEM/EDS in transmission mode
       V-D Hodoroaba, S Rades, T Salge, J Mielke, E Ortel and R Schmidt    012006

- Fundamentals of electron energy-loss spectroscopy
       F Hofer, F P Schmidt, W Grogger and G Kothleitner    012007

- Quantitative ADF STEM: acquisition, analysis and interpretation
       L Jones    012008

- PENEPMA: a Monte Carlo programme for the simulation of X‑ray emission in EPMA
       X Llovet and F Salvat    012009

- SEM and FIB-SEM investigations on potential gas shales in the Dniepr-Donets Basin (Ukraine): pore space evolution in organic matter during thermal maturation
       D Misch, F Mendez-Martin, G Hawranek, P Onuk, D Gross and R F Sachsenhofer    012010

- Effect of shape and thickness of asbestos bundles and fibres on EDS microanalysis: a Monte Carlo simulation
       D Moro and G Valdrè    012011

- Effects of cold rolling deformation on microstructure in 18/8 grade stainless steel
       A Núñez Galindo and J F Almagro Bello    012012

- Quantification of low concentration elements using soft X-rays at high spatial resolution
       P T Pinard and S Richter    012013

- Combined EPMA, FIB and Monte Carlo simulation: a versatile tool for quantitative analysis of multilayered structures
       S Richter and P T Pinard    012014

- Electron probe microanalysis of the dopant concentrations in complex perovskite ferroelectrics
       Z Samardžija    012015

- Improved spectrum simulation for validating SEM-EDS analysis
       P Statham, C Penman and P Duncumb    012016

- Development of soft X-ray emission spectrometer for EPMA/SEM and its application
       H Takahashi, T Murano, M Takakura, S Asahina, M Terauchi, M Koike, T Imazono, M Koeda and T Nagano    012017

- Physics-based simulation models for EBSD: advances and challenges
       A Winkelmann, G Nolze, M Vos, F Salvat-Pujol and W S M Werner   012018

- Low voltage imaging and X-ray microanalysis in the SEM: challenges and opportunities
       R Wuhrer and K Moran    012019

- Pyrite-pyrrhotite intergrowths in calcite marble from Bistriški Vintgar, Slovenia
       J Zavašnik    012020