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PROCEEDINGS OF THE EMAS 2013 EUROPEAN WORKSHOP

13th European Workshop in Porto, Portugal
Edited by: X. Llovet, M.B. Matthews, F. Brisset, F. Guimarães and J.M. Vieira
IOP Conf. Ser.: Mater. Sci. Eng.  (2014)  55  [doi: 10.1088/1757-899X/55/]

            This volume of the IOP Conference Series: Materials Science and Engineering contains papers from the 13th Workshop of the European Microbeam Analysis Society (EMAS) on Modern Developments and Applications in Microbeam Analysis which took place from the 12th to the 16th of May 2013 in the Centro de Congressos do Alfândega, Porto, Portugal.

            The primary aim of this series of workshops is to assess the state-of-the-art and reliability of microbeam analysis techniques.  The workshops also provide a forum where students and young scientists starting out on a career in microbeam analysis can meet and discuss with the established experts.  The workshops have a very specific format comprising invited plenary lectures by internationally recognized experts, poster presentations by the participants and round table discussions on the key topics led by specialists in the field.  This workshop was organized in collaboration with LNEG - Laboratório Nacional de Energia e Geologia and SPMICROS - Sociedade Portuguesa de Microscopia.  The technical programme included the following topics: electron probe microanalysis, future technologies, electron backscatter diffraction (EBSD), particle analysis, and applications.

            As at previous workshops there was also a special oral session for young scientists.  The best presentation by a young scientist was awarded with an invitation to attend the 2014 Microscopy and Microanalysis meeting at Hartford, Connecticut.  The prize went to Shirin Kaboli, of the Department of Metals and Materials Engineering of McGill University (Montréal, Canada), for her talk entitled “Plastic deformation studies with electron channelling contrast imaging and electron backscattered diffraction”.

            The continuing relevance of the EMAS workshops and the high regard in which they are held internationally can be seen from the fact that 74 posters from 21 countries were on display at the meeting and that the participants came from as far away as Japan, Canada and the USA.  A selection of participants with posters was invited to give a short oral presentation of their work in three dedicated sessions.  The prize for the best poster was an invitation to participate in the 22nd Australian Conference on Microscopy and Microanalysis (ACMM 23) at Adelaide, South Australia.  The prize was awarded to Pierre Burdet of the EM Group of the Department of Materials Science and Metallurgy of the University of Cambridge (UK), for the poster entitled: “3D EDS microanalysis by FIB SEM: advantages of a low take-off angle”.

            This proceedings volume contains the full texts of 8 of the invited plenary lectures and of 13 papers on related topics originating from the posters presented at the workshop.  All the papers have been subjected to peer review by a least two referees.

Acknowledgements

            On behalf of the European Microbeam Analysis Society I would like to thank all the invited speakers, session chairs and members of the discussion panels for making the meeting such a great success.  Special thanks go to Fernanda Guimarães and Luc Van’t dack who directed the organisation of the workshop giving freely of their time and talents.  As was the case for previous workshops, the EMAS board in corpore was responsible for the scientific programme.  The Workshop also included a commercial exhibition where many leading instrument suppliers were represented. Several companies that exhibited provided financial support, either by sponsoring an event or by advertising.

            Below, in alphabetical order, is a list of exhibiting companies and sponsors of the workshop:
-    Ametek GmbH, Edax Business Unit
-    Bruker Nano GmbH
-    Cameca SA
-    Câmara Municipal do Porto
-    European Institute for Transuranium Elements (Germany)
-    FEI Company
-    IZASA Group Werfen
-    Jeol (Europe) SAS
-    Porto Gran Cruz
-    Oxford Instruments NanoAnalysis Ltd.
-    Probe Software, Inc.
-    Tescan, a.s.

Michael B. Matthews
EMAS President

Table of contents (manuscript nos. in bold)

- Study of multi-carbide B4C-SiC(Al, Si) reaction infiltrated composites by SEM with EBSD
       B A Almeida, M C Ferro, A Ravanan, P M F Grave, H-Y Wu, M X Gao, Y Pan, F J Oliviera, A B Lopes and J M Vieira    012001

- Measurement and Monte Carlo simulation of the spatial resolution in element analysis with the FEG-EPMA JEOL JXA-8530F
       D Berger and J Nissen    012002

- Measuring conditions for second order X-ray Bragg-spectrometry
       J Dellith, A Scheffel and M Wendt    012003

- Specimen homogeneity requirements for EDS in high count rate mode
       F Eggert, M Schleifer and F Reinauer    012004

- Understanding the structure of nanocatalysts with the high resolution scanning/transmission electron microscope
       L D Francis, J Rivas and M José-Yacaman    012005

- Electron microprobe analysis of cryolite
       F Guimarães, P Bravo Silva, J Ferreira, A P Piedade and M T F Vieira    012006

- Electron channelling contrast observations in deformed Mg alloys prepared with ion milling
       S Kaboli, P T Pinard, J Su, S Yue and R Gauvin    012007

- SEM, TEM and SLEEM (scanning low energy electron microscopy) of CB2 steel after creep testing
       J Kasl, S Mikmekova and D Jandova    012008

- Characterisation of sub-micrometre features with the FE-EPMA
       P McSwiggen    012009

- Phase analysis in duplex stainless steel: comparison of EBSD and quantitative metallography methods
       J Michalska and B Chmiela    012010

- Recent developments in two fundamental aspects of electron backscatter diffraction
       K P Mingard, A P Day and P N Quested    012011

- Microstructure of nanocomposite carbon-, MoS₂- and MoO₃-based solid-lubricant coatings
       T Moskalewicz, B Wendler and A Czyrska-Filemonowicz    012012

- High-resolution EPMA X-ray images of mother liquid inclusions in a Pd2Ga single crystal
       D Müller, J Schwerin, P Gille and K T Fehr    012013

- A new application of SIMS to the analysis of nitrogen in mica minerals: tobelite
       L P Ottolini, F Scordari and E Mesto    012014

- Identification of corrosion and damage mechanisms by using scanning electron microscopy and energy-dispersive X-ray microanalysis: contribution to failure analysis case histories
       G Pantazopoulos and A Vazdirvanidis    012015

- Improving the quantification at high spatial resolution using a field emission electron microprobe
       P T Pinard and S Richter    012016

- Prospects for higher spatial resolution quantitative X-ray analysis using transition element L-lines
       P Statham and J Holland    012017

- Nanoscale characterisation of semiconductors by cathodoluminescence
       K Thonke, I Tischer, M Hocker, M Schirra, K Fujan, M Wiedenmann, R Schneider, M Frey and M Feneberg   012018

- Scanning probe – atomic force microscopy: new developments and applications
       G Valdrè, D Moro and G Ulian    012019

- A review of advances and challenges in EBSD strain mapping
       A J Wilkinson, T B Britton, J Jiang and P S Karamched    012020

- Quantitative X-ray mapping, scatter diagrams and the generation of correction maps to obtain more information about your material
       R Wuhrer and K Moran    012021