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EMAS 2016 'Book of Tutorials and Abstracts'

60,00 € each



Contains the full text of the invited lectures and the abstracts of the poster
(R. Podor, ed.) - ISBN: 978 90 8227 692 3.
312 p., published by EMAS and CEA Marcoule.


Table of Contents

-  Table of contents                                                                                                                        3

-  Foreword                                                                                                                                      5

-  EMAS 2016 Welcome and Opening Address                                                                        8

-  European Microbeam Analysis Society (EMAS):     Executive Board                              9

                                                                                               Sustaining Companies                  13

-  EMAS 2016 International Scientific and Local Organising Committees                        15

-  Workshop programme                                                                                                            17

-  Sponsors                                                                                                                                   21

Principles of electron probe microanalysis                                                                        17

      Introduction to electron backscatter diffraction: past and settings, everyday work.                                                                                                                  25

       François Brisset

      Introduction to EPMA and SEM.                                                                                         47

       Hans Dijkstra

      Light element analysis  .                                                                                                       57

       Hans Dijkstra

      Quantification in electron probe microanalysis.                                                              67

       Xavier Llovet

      Performance characteristics of WDS and EDS detectors.                                                    83

       Michael B. Matthews

      Sample preparation for EPMA.                                                                                           115

       Silvia Richter

      Principles and practice of variable pressure / environmental SEM imaging and microanalysis.                                                                                                                143

          Debbie J. Stokes

Rare and noble elements: from ore deposits to high-tech materials                              159

      From the physics of secondary electron emission to image contrast in scanning electron microscopy; a tribute to Jacques Cazaux.                                                               161

       Christian Mathieu

      Mitigating charging and beam damage in EPMA of non-conductive materials.                                                                                                      163

       Stuart L. Kearns and B. Buse

      High spatial resolution imaging and X-ray microanalysis of non-conductive materials.                                                                                                            175

       Hendrix Demers, N. Brodusch and R. Gauvin

      µ-XRF compared to EDS of coated samples.                                                                    189

       Mathias Procop

      Application of microanalysis in the variable pressure SEM: new guidelines for an accurate practice.                                                                    ²                           199

       Lahcen Khouchaf

      Combining analysis techniques for the characterisation of geological materials.                                                                                                    209

       Anne-Magali Seydoux-Guillaume

      Working with the ESEM at high temperature.                                                                   223

       Renaud Podor

      Introduction to gunshot residue analysis and recent advances.                                          241

       Richard Wuhrer and K. Mason

      Copper and noble metals in medicine: application, diseases and occurrence in the human body.                                                                                                  265

       Magaly Tribet, X. Deschanels, S. Peuget, C. Jegou, K. Hanifi, J. Noirot and J. Lamontagne

      SEM advanced image analysis tools applied to cement and concrete microstructure: a review of spectro-spatial strategies and cases of application.                                                                                    283

       Samuel Meulenyzer

      SEM techniques for bio- and organo-mineral interface characterisation in the environment.                                                                                                                          305

       Guillaume Wille, C. Michel, J. Hellal, A. Richard, A. Burel, P. Ollivier and L. Joly

Abstracts of the poster presentations                                                                                  321

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