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EMAS 2011 'Book of Tutorials and Abstracts'

emas2011_bota_titlepage
60,00 € each
Format

Price Member: EUR 42 each
Price Non-member: EUR 60 each

Contains the full text of the invited lectures and the abstracts of the poster contributions.
396 p., published by EMAS.

 

TABLE OF CONTENTS

-   Table of contents

-   Welcome address by the Chairman of the Local Organising Committee                                      5

-   EMAS Presidents’ address                                                                                                                 7

-   European Microbeam Analysis Society:    Executive Board                                                         9

                                                                       Sustaining Companies                                             13

-   International Scientific Committee                                                                                             17

    Local Organising Committee

-   Exhibitors                                                                                                                                    19

-   Sponsors                                                                                                                                      21

-   Workshop programme                                                                                                                 23

-   Tutorials                                                                                                                                      33

  • High-resolution X-ray spectrometry. 35

          Philippe Jonnard

  • Trace analysis in EPMA. 51

          Michael J. Jercinovic, M.L. Williams, J. Allaz and J.J. Donovan

  • Multivariate statistical analysis of hyperspectral microanalysis datasets. 77

          John Henry J. Scott and J. Davis

  • Uncertainty and capability of quantitative EPMA at low voltage. 99

          Claude Merlet and X. Llovet

  • X-ray microanalysis: the state-of-the-art of SDD detectors and WDS systems on scanning electron microscopes (SEM).119

          Laurent Maniguet, F. Robaut, A. Meuris, F. Roussel-Dherbey and F. Charlot

  • Mineral surface - organic matter interactions and applications.137

          Giovanni Valdrè

  • Application of microbeam analysis to photovoltaics.153

          Verónica Bermudez

  • Electron probe microbeam analysis of volcanic ash.163

          Stuart L. Kearns

  • Microbeam analysis of irradiated nuclear materials.177

          Clive T. Walker, S. Brémier, P. Pöml, D. Papaioannou and P.W.D. Bottomley

  • Nuclear reaction analysis (NRA) at the micrometre scale.201

          Hicham Khodja

  • LIBS for microanalysis - tool or toy?215

          J. Riedel, I. Gornushkin and Ulrich Panne

  • Multi-scale Raman microanalysis of ill-organized solids, at the laboratory or with portable instruments.225

          Philippe Colomban

  • Texture and phase analysis at the nanoscale: new application of electron diffraction in the TEM.239

          Edgar F. Rauch, M. Véron, S. Lay, L. Andre and M. Gemmi

  • X-ray microanalysis in low-vacuum SEM.243

          Robert A. Carlton

  • Contrast mechanisms of low-loss backscattered electrons in a field emission SEM.255

          Heiner Jaksch

  • Microanalysis in a FIB/SEM: EDX in 3D. What can we expect, where are the limits ...?271

          Marco Cantoni and P. Burdet

  • Quantitative microstructural analysis by orientation contrast microscopy.287

          Leo A. Kestens, R. Decocker and R.H. Petrov

-   Abstracts of presentations in the Young Scientists’ Session                                                      305

  • 3D EDS microanalysis by FIB-SEM: enhancement of elemental quantification.
  1. , C. Hébert and M. Cantoni
  • The application of VP-SEM in microstructure analysis of ceramic macroporous scaffolds for bone tissue engineering.

          A.M. Janus and M. Faryna

  • EPMA and EBSD analysis of the chemical and structural changes during deformation of 16% chromium stainless steel.

          A. Nuñez Galindo, X. Llovet and J.F. Almagro

  • EPMA and SIMS investigations of a zircon crystal from the Chernobyl “lava”.

          P. Pöml, B. Burakov, T. Geisler, R. Hasnaoui and C.T. Walker

  • Limits of detection of µ-XRF with the SEM/EDS for RoHS relevant elements.

          V. Rackwitz, M. Ostermann, U. Panne and V.-D. Hodoroaba

  • Electron microprobe investigations of crystal chemistry and phase relations in gallate and aluminate systems for optical applications.

          A. Richter, and M. Göbbels

-   Abstracts of presentations by respectively the MAS-USA and AMAS Student Award Winners                                                                                                                                   313

  • An API/GUI for Monte Carlo simulation of EPMA spectra using PENELOPE.

          P.T. Pinard, H. Demers, F. Salvat and R. Gauvin

-   Abstracts of the poster presentations                                                                                          317

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