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Contains the full text of the invited lectures and the abstracts of the poster contributions.
297 p., published by EMAS.

TABLE OF CONTENTS

-   Table of contents

-   Welcome address by the Chairman of the Local Organising Committee                                      5

-   EMAS Presidents’ address                                                                                                                 7

-   European Microbeam Analysis Society:    Executive Board                                                         9

                                                                       Sustaining Companies                                             11

-   International Scientific Committee                                                                                             15

    Local Organising Committee

-   Exhibitors                                                                                                                                    17

-   Sponsors                                                                                                                                      19

-   Workshop programme                                                                                                                 21

-   Tutorials                                                                                                                                      31

• 75 years of Kossel patterns. 33

Enrico Langer and S. Däbritz

• State of the art in EBSD technology. 53

Karsten Kunze

• Overview of new tools to evaluate large EDS datasets. 55

Hans Dijkstra

• Applications of fast high resolution and high sensitivity EDS analysis. 57

Edward D. Boyes

• Using DTSA-II to simulate and interpret energy-dispersive spectra from particles. 63

Nicholas W.M. Ritchie

• Microbeam analysis in Poland - past and future. 79

Jan Kusiński

• EPMA: why we still need it. 83

Jürgen Börder

• Combining high-resolution EPMA with hyperspectral cathodoluminescence and X‑ray analysis. 85

Colin MacRae, N.C. Wilson, A. Torpy and M. Pownceby

• Uncertainties in electron probe microanalysis. 97

Ryna B. Marinenko and S. Leigh

• 3D nano-characterisation of materials by FIB-SEI/EDS tomography.111

Fernando Lasagni, A.F. Lasagni, C. Holzapfel and F. Mücklich

• 3-dimensional orientation microscopy using FIB-EBSD tomography: an overview on techniques, applications, and limits.123

Stephan Zaefferer

• Nanoscale analysis in 3D using electron tomography.137

Paul Midgley

• The role of atom-probe tomography in materials science.151

Didier Blavette, E. Cadel, O. Cojocaru-Mirédin and B. Deconihout

• Petrology - microbeam analysis of core samples from drilled exploration wells and outcrops.165

Johannes M. Rykkje, E. Rein, G. Torkildsen and G. Halvorsen

• Scanning electron beam-based automated mineralogy - outline of technology and selected applications in the natural resources industry.169

R. Dobbe, P. Gottlieb, Y. Gu, A.R. Butcher, R. Fandrich and Herman Lemmens

• Microanalysis in the metals recycling industry.191

Eddy Boydens

• Application of X-ray microanalytical methods to mining related environmental problems.207

János Osán, A. Alsecz, I. E. Sajó and S. Török

-   Abstracts of presentations in the Young Scientists’ Session                                                      225

• HAADF-STEM tomography and EDX microanalysis of nanoparticles in oxide dispersion strengthened alloys.

G. Cempura, A. Kruk, J.C. Hernandez, P.A. Midgley, B. Dubiel and A. Czyrska‑Filemonowicz

• The effect of hydrogen on the properties of a Ti-6Al-4V alloy surface layer.

B. Chmiela and M. Sozańska

• Combined SEM/EDX and XRD analyses for the characterisation of apatite layer formation on a bioglass composite surface.

J. Kokoszka, K. Cholewa-Kowalska and M. Łączka

• Determination up to 50 keV of the efficiency of an energy-dispersive X-ray spectrometer with a SEM using a calibrated reference spectrometer.

V. Rackwitz, V.-D. Hodoroaba, M. Procop, A. Warrikhoff and U. Panne

• Analysis of americium in UMo polyphase glass-ceramics samples by WDS.

M. Tribet, J.-M. Boubals and L. Bojat

• Application of focussed ion beam technique for TEM multilayer materials examination.

J. Wojewoda-Budka, P. Zięba, J. Morgiel and N. Sobczak

-   Abstracts of the poster presentations                                                                                          233