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Price Non-member: EUR 60 each

Contains the full text of the invited lectures and the abstracts of the poster contributions.
314 p., published by EMAS.

TABLE OF CONTENTS

-   Table of contents

-   Welcome address by the Chairman of the Local Organising Committee                                      5

-   EMAS Presidents’ address                                                                                                                 7

-   European Microbeam Analysis Society:    Executive Board                                                         9

                                                                       Sustaining Companies                                             11

-   International Scientific Committee                                                                                             15

    Local Organising Committee

-   Exhibitors                                                                                                                                    17

-   Sponsors                                                                                                                                      19

-   Workshop programme                                                                                                                 21

-   Tutorials                                                                                                                                      31

• Multilayer crystals for light element analysis. 33

Stephen J.B. Reed

• Conventional wavelength-dispersive X-ray spectrometry versus parallel beam spectroscopy - a basic overview. 41

Corrie J.G. van Hoek and M. Koolwijk

• Application of focused ion beam SIMS in materials science. 53

David S. McPhail, R.J. Chater and L. Li

• Fundamentals and applications of cluster SIMS. 73

Chris Szakal and G. Gillen

• Application of FIB/SEM tomographic spectral imaging to the analysis of a braze joint. 89

Paul G. Kotula

• Basic EELS: on recent trends and applications. 99

Bernard Jouffrey

• Model-based quantification of EELS: is standardless EELS quantification possible?.113

Jo Verbeeck and G. Bertoni

• The impact of aberration-correction on analytical STEM.121

Peter D. Nellist

• Sub-Ångstrom and sub-eV analytical TEM: applications in materials science.131

Joachim Mayer, L. Houben, S. Lopatin, M. Luysberg, A. Thust and T. Weirich

• Advances in synchrotron X-ray fluorescence spectro-microscopy.137

Jean Susini

• X-ray fluorescence as an additional method for a scanning electron microscope.147

Mathias Procop and V.-D. Hodoroaba

• Developments in and possibilities of 3D micro X-ray fluorescence spectroscopy.159

Birgit Kanngiesser

• Microanalysis using a µ-XRF system.163

Michael Haschke

• Microbeam analysis applied to adhesion, surfaces and interfaces.175

John F. Watts

• Applications of microanalysis in the cultural heritage field.187

Ineke Joosten

• Application of combined SEM/EDX and µ-Raman approaches for the chemical and structural characterisation of fine particulates.199

Anna De Maeyer-Worobiec, E.A. Stefaniak, A. Brooker and R.E. Van Grieken

• Forensic applications of microbeam analysis.209

Johann P. Krüsemann

-   Abstracts of presentations in the Young Scientists’ Session                                                      221

• The optimization of focused ion beam secondary ion mass spectrometry (FIB‑SIMS) for applications in materials science.

Libing Li and D.S. McPhail

• Combined elemental and phase analysis of fly-ash by EPMA and XRD techniques.

Elzbieta Augustyn, J. Łączny and M. Żelechower

• Microanalysis of B-, C- and Fe-containing melts for nuclear reactor severe accident studies.

Sergio Sao Joao, C. Duriez, C. Dominguez and D. Jacquemain

• Evaluation of electron beam damage of SiO₂/Si in Auger microprobe analysis.

Hideyuki Sato, S. Fukushima, T. Kimura and S. Tanuma

• Precise estimation of atom column positions from the phase of a reconstructed electron exit wave.

Sandra Van Aert, S. Bals, G. Van Tendeloo and D. Van Dyck

• Identification of pigments with a combined µ-XRF/µ-Raman instrument and its comparison with µ-XRD analysis.

Geert Van der Snickt, K. Janssens, W. De Nolf and B. Vekemans

-   Abstracts of the poster presentations                                                                                          231