EMAS Shop Menu

My Shopping Cart

The cart is empty

Welcome to the EMAS Shop!

Thank you for visiting the EMAS Webshop. It is fully functional already, however, we are still improving it and we are adding items to the shop that can be purchased. If you find an item you are interested in please don't hesitate and order it.

We are also grateful for any suggestions and feedback.

Payment is possible via PayPal (credit cards, etc) or offline (bank transfer, etc).
All prices are including packaging and shipment.

EMAS members benefit of a 30 % discount on all items! Regular EMAS membership is only EUR 30 per year.

Electronic (PDF) items are sent to you via email after purchase.

Please browse the categories / items below:

EMAS 2007 'Book of Abstracts'

60,00 € each

Price Member: EUR 42 each
Price Non-member: EUR 60 each

Contains the full text of the invited lectures and the abstracts of the poster contributions.
314 p., published by EMAS.



-   Table of contents

-   Welcome address by the Chairman of the Local Organising Committee                                      5

-   EMAS Presidents’ address                                                                                                                 7

-   European Microbeam Analysis Society:    Executive Board                                                         9

                                                                       Sustaining Companies                                             11

-   International Scientific Committee                                                                                             15

    Local Organising Committee

-   Exhibitors                                                                                                                                    17

-   Sponsors                                                                                                                                      19

-   Workshop programme                                                                                                                 21

-   Tutorials                                                                                                                                      31

  • Multilayer crystals for light element analysis. 33

Stephen J.B. Reed

  • Conventional wavelength-dispersive X-ray spectrometry versus parallel beam spectroscopy - a basic overview. 41

Corrie J.G. van Hoek and M. Koolwijk

  • Application of focused ion beam SIMS in materials science. 53

David S. McPhail, R.J. Chater and L. Li

  • Fundamentals and applications of cluster SIMS. 73

Chris Szakal and G. Gillen

  • Application of FIB/SEM tomographic spectral imaging to the analysis of a braze joint. 89

Paul G. Kotula

  • Basic EELS: on recent trends and applications. 99

Bernard Jouffrey

  • Model-based quantification of EELS: is standardless EELS quantification possible?.113

Jo Verbeeck and G. Bertoni

  • The impact of aberration-correction on analytical STEM.121

Peter D. Nellist

  • Sub-Ångstrom and sub-eV analytical TEM: applications in materials science.131

Joachim Mayer, L. Houben, S. Lopatin, M. Luysberg, A. Thust and T. Weirich

  • Advances in synchrotron X-ray fluorescence spectro-microscopy.137

Jean Susini

  • X-ray fluorescence as an additional method for a scanning electron microscope.147

Mathias Procop and V.-D. Hodoroaba

  • Developments in and possibilities of 3D micro X-ray fluorescence spectroscopy.159

Birgit Kanngiesser

  • Microanalysis using a µ-XRF system.163

Michael Haschke

  • Microbeam analysis applied to adhesion, surfaces and interfaces.175

John F. Watts

  • Applications of microanalysis in the cultural heritage field.187

Ineke Joosten

  • Application of combined SEM/EDX and µ-Raman approaches for the chemical and structural characterisation of fine particulates.199

Anna De Maeyer-Worobiec, E.A. Stefaniak, A. Brooker and R.E. Van Grieken

  • Forensic applications of microbeam analysis.209

Johann P. Krüsemann

-   Abstracts of presentations in the Young Scientists’ Session                                                      221

  • The optimization of focused ion beam secondary ion mass spectrometry (FIB‑SIMS) for applications in materials science.

Libing Li and D.S. McPhail

  • Combined elemental and phase analysis of fly-ash by EPMA and XRD techniques.

Elzbieta Augustyn, J. Łączny and M. Żelechower

  • Microanalysis of B-, C- and Fe-containing melts for nuclear reactor severe accident studies.

Sergio Sao Joao, C. Duriez, C. Dominguez and D. Jacquemain

  • Evaluation of electron beam damage of SiO2/Si in Auger microprobe analysis.

Hideyuki Sato, S. Fukushima, T. Kimura and S. Tanuma

  • Precise estimation of atom column positions from the phase of a reconstructed electron exit wave.

Sandra Van Aert, S. Bals, G. Van Tendeloo and D. Van Dyck

  • Identification of pigments with a combined µ-XRF/µ-Raman instrument and its comparison with µ-XRD analysis.

Geert Van der Snickt, K. Janssens, W. De Nolf and B. Vekemans

-   Abstracts of the poster presentations                                                                                          231

The cart is empty