Price Member: EUR 42 each
Price Non-member: EUR 60 each
Contains the full text of the invited lectures and the abstracts of the poster contributions.
372 p., published by EMAS.
TABLE OF CONTENTS
- Table of contents
- Welcome address by the Chairman of the Local Organising Committee 5
- IUMAS and EMAS Presidents’ address 7
- European Microbeam Analysis Society: Executive Board 9
- International Scientific Committee 13
Local Organising Committee
- Exhibitors 15
- Sponsors 17
- Workshop programme 19
- Tutorials 27
- Imaging single atoms with Z-contrast STEM in two and three dimensions. 29
Paul M. Voyles
- Atomic level characterisation based on focus modulation electron microscopy. 41
Yoshizo Takai, M. Taya, H. Chikada and Y. Kimura
- Advances in orientation imaging in the TEM and application to nano-structures. 53
David J. Dingley
- Advances in electron backscatter diffraction for the characterisation of interfaces. 55
- Scanning probe microscopy of peptide-wrapped single-walled carbon nano‑tubes. 67
Inga Holl Musselman, V. Zorbas, A. Ortiz-Acevedo, H. Xie, G.R. Dieckmann, R.K. Draper and R.H. Baughman
- Semi-quantitative analysis of microstructures by secondary ion mass spectrometry. 73
- Particle-induced X-ray emission with microbeams: main features and applications. 81
Pier Andrea Mandò
- Imaging and microanalysis in environmental scanning electron microscopy. 85
Bradley L. Thiel
- ESEM applications: from cultural heritage conservation to nano-behaviour. 97
- Microanalysis with XPEEM, LEEM, diffraction and spectroscopy.109
Ernst G. Bauer
- Three-dimensional atom probe characterisation of metallic nano-structures.119
- Developments in multi-signal microanalytical characterisation techniques using a scanning electron beam.139
Simon A. Galloway, P.J. Thomas and J. Wilbrink
- Cathodoluminescence microscopy and spectroscopy of opto-electronic materials.149
Matthew R. Phillips
- Low-energy X-ray spectrometry technique as applied to semiconductors.165
- Quantitative bulk and trace element X-ray mapping using multiple detectors.175
Ken Moran and R. Wuhrer
- Determination of the efficiency of energy-dispersive X-ray spectrometers by a new reference material.189
M. Alvisi, M. Blome, M. Griepentrog, V.-D. Hodoroaba, P. Karduck, M. Mostert, M. Nacucchi, Matthias Procop, M. Rohde, F. Scholze, P. Statham, R. Terborg and J.-F. Thiot
- Monte Carlo simulation in EPMA. Comparison of different simulation algorithms.
Francesc Salvat, X. Llovet, J.M. Fernández-Varea and J. Sempau
- Quantitative X-ray microanalysis of heterogeneous materials using Monte Carlo simulations.217
- Abstracts of presentations in the Young Scientists’ Session 233
- The external proton microprobe at the Tandem Laboratory in Florence.
M. Massi, L. Giuntini and P.A. Mandò
- Synthesis and characterisation of doped and un-doped zinc oxide nanostructures.
K.E. McBean, M.R. Phillips and E.M. Goldys
- Analysis of aluminium-magnesium diffusion couples.
K. Robertson, P. Horny, R. Gauvin and M. Pekguleryuz
- The L spectra of Fe and Fe3O4.
A. Scheffel, A. Assmann, J. Dellith and M. Wendt
- Compositional analysis of 17th - 18th century archaeological glass fragments excavated in Mechelen, Belgium: comparison with data from neighbouring cities in the Low Countries.
V. Van der Linden, E. Bultinck, J. De Ruytter, O. Schalm, K. Janssens, W. Devos and W. Tiri
- In-situ investigation of discolouration processes between historic oil paint pigments.
R. White, M.R. Phillips, P. Thomas and R. Wührer
- Abstracts of the poster presentations 241