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EMAS 2005 'Book of Abstracts'

60,00 € each

Price Member: EUR 42 each
Price Non-member: EUR 60 each

Contains the full text of the invited lectures and the abstracts of the poster contributions.
372 p., published by EMAS.



-   Table of contents

-   Welcome address by the Chairman of the Local Organising Committee                                      5

-   IUMAS and EMAS Presidents’ address                                                                                       7

-   European Microbeam Analysis Society:    Executive Board                                                         9

                                                                       Sustaining Companies

-   International Scientific Committee                                                                                             13

    Local Organising Committee

-   Exhibitors                                                                                                                                    15

-   Sponsors                                                                                                                                      17

-   Workshop programme                                                                                                                 19

-   Tutorials                                                                                                                                      27

  • Imaging single atoms with Z-contrast STEM in two and three dimensions. 29

Paul M. Voyles

  • Atomic level characterisation based on focus modulation electron microscopy. 41

Yoshizo Takai, M. Taya, H. Chikada and Y. Kimura

  • Advances in orientation imaging in the TEM and application to nano-structures. 53

David J. Dingley

  • Advances in electron backscatter diffraction for the characterisation of interfaces. 55

Valerie Randle

  • Scanning probe microscopy of peptide-wrapped single-walled carbon nano‑tubes. 67

Inga Holl Musselman, V. Zorbas, A. Ortiz-Acevedo, H. Xie, G.R. Dieckmann, R.K. Draper and R.H. Baughman

  • Semi-quantitative analysis of microstructures by secondary ion mass spectrometry. 73

Douglas Phinney

  • Particle-induced X-ray emission with microbeams: main features and applications. 81

Pier Andrea Mandò

  • Imaging and microanalysis in environmental scanning electron microscopy. 85

Bradley L. Thiel

  • ESEM applications: from cultural heritage conservation to nano-behaviour. 97

Eric Doehne

  • Microanalysis with XPEEM, LEEM, diffraction and spectroscopy.109

Ernst G. Bauer

  • Three-dimensional atom probe characterisation of metallic nano-structures.119

Kazuhiro Hono

  • Developments in multi-signal microanalytical characterisation techniques using a scanning electron beam.139

Simon A. Galloway, P.J. Thomas and J. Wilbrink

  • Cathodoluminescence microscopy and spectroscopy of opto-electronic materials.149

Matthew R. Phillips

  • Low-energy X-ray spectrometry technique as applied to semiconductors.165

Pierre-François Staub

  • Quantitative bulk and trace element X-ray mapping using multiple detectors.175

Ken Moran and R. Wuhrer

  • Determination of the efficiency of energy-dispersive X-ray spectrometers by a new reference material.189

M. Alvisi, M. Blome, M. Griepentrog, V.-D. Hodoroaba, P. Karduck, M. Mostert, M. Nacucchi, Matthias Procop, M. Rohde, F. Scholze, P. Statham, R. Terborg and J.-F. Thiot

  • Monte Carlo simulation in EPMA. Comparison of different simulation algorithms.


Francesc Salvat, X. Llovet, J.M. Fernández-Varea and J. Sempau

  • Quantitative X-ray microanalysis of heterogeneous materials using Monte Carlo simulations.217

Raynald Gauvin

-   Abstracts of presentations in the Young Scientists’ Session                                                      233

  • The external proton microprobe at the Tandem Laboratory in Florence.

M. Massi, L. Giuntini and P.A. Mandò

  • Synthesis and characterisation of doped and un-doped zinc oxide nanostructures.

K.E. McBean, M.R. Phillips and E.M. Goldys

  • Analysis of aluminium-magnesium diffusion couples.

K. Robertson, P. Horny, R. Gauvin and M. Pekguleryuz

  • The L spectra of Fe and Fe3O4.

A. Scheffel, A. Assmann, J. Dellith and M. Wendt

  • Compositional analysis of 17th - 18th century archaeological glass fragments excavated in Mechelen, Belgium: comparison with data from neighbouring cities in the Low Countries.

V. Van der Linden, E. Bultinck, J. De Ruytter, O. Schalm, K. Janssens, W. Devos and W. Tiri

  • In-situ investigation of discolouration processes between historic oil paint pigments.

R. White, M.R. Phillips, P. Thomas and R. Wührer

-   Abstracts of the poster presentations                                                                                          241

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