Price Member: EUR 42 each
Price Non-member: EUR 60 each
Contains the full text of the invited lectures and the abstracts of the poster contributions.
364 p., published by EMAS.
TABLE OF CONTENTS
- Table of contents
- Welcome Address from the Chairmen of the Workshop 5
- EMAS President's Address 7
- European Microbeam Analysis Society: Executive Board 9
Sustaining Companies
- International Scientific Committee 13
Local Organising Committee
- Exhibitors 15
- Sponsors 17
- Workshop programme 19
- Tutorials 27
- Strategy for applying microanalytical techniques. 29
Wim G. Sloof and L.P.H. Jeurgens
- Certified reference materials for carbon and nitrogen for microanalysis. 39
Stuart R.J. Saunders, P. Karduck and W.G. Sloof
- Applications of micro- and surface analysis techniques for the development of steel products and applications. 49
Henri Dillen, A. De Vyt, C. Xhoffer, E. Leunis, S. Claessens and A. Dhont
- Quantitative analysis of thin specimens in the TEM using a φ(σz)-model. 73
Gerben Boon and G.F. Bastin
- Development and certification of NIST standard reference materials for relative Raman intensity calibration. 89
Edgar S. Etz, S.J. Choquette and W.S. Hurst
- Electron beam techniques in the Earth sciences.105
John T. Armstrong
- Ion microprobe analysis in Earth science and cosmochemistry.107
Marc Chaussidon
- Understanding the distribution of platinum-group elements in some mineral deposits; comparison of trace element analyses obtained by electron microprobe and micro‑PIXE.121
Fernando Gervilla, L.J. Cabri, K. Kojonen, T. Oberthür, T. Weiser, B. Johanson, S.H. Sie, J.L. Campbell, W.J. Teesdale and J.H.G. Laflamme
- Analysis of uranium, actinides and fission products by SIMS (in different matrices).137
Gabriele Tamborini
- X-ray optics in microbeam analysis.149
Michael Hashke
- Microcalorimeter EDS detectors and their application in low-voltage SEM based microanalysis.163
Edward A. Kenik, D.C. Joy and D. Redfern
- Monte Carlo simulation of electron transport and X-ray generation.179
Francesc Salvat, X. Llovet and J.M. Fernández-Varea
- X-ray microanalysis of real materials using Monte Carlo simulations.209
Raynald Gauvin and E. Lifshin
- Electron backscatter diffraction (EBSD) applied to mineral samples.225
David J. Prior
- The use of electron backscatter diffraction for the investigation of nano-crystalline materials and the move towards orientation imaging in the TEM.227
David J. Dingley and M.N. Nowell
- Image formation in the low-vacuum SEM..241
Bradley L. Thiel
- EDS microanalysis in the low-vacuum SEM.251
Johann Wernisch
- Abstracts of presentations in the Young scientists’ session 257
- Determination of thickness of ultra-thin films on Si substrates by EPMA.
C.S. Campos, M.A.Z. Vasconcellos, X. Llovet and F. Salvat
- Transmission electron microscopy study on the formation of Al18B4O33 whiskers.
A. Carazeanu, V. Ciupina, C.Gh. Guguta and G. Prodan
- A comparison of the M-spectra of the elements 55 Cs and 56 Ba with that of 57 La and 58 Ce.
J. Dellith and M. Wendt
- Microanalytical study of corrosion products on ancient copper alloys containing arsenic and tin.
A. De Ryck, A. Adriaens and F. Adams
- Composition modulation in low-temperature growth of InGaAs/GaAs system: influence on plastic relaxation.
M. Herrera Collado, D. González, M.U. González, Y. González, L. González and R. García-Roja
- Crystalline inclusion and dislocation detection in C+N+B co-implanted in silicon (111).
- Ponce Pedraza, F.M. Morales Sánchez, S.I. Molina Rubio, T. Ben Fernández, R. García-Roja, L. Barbadillo, M. Cervera, M.J. Hernández, P. Rodríguez and J. Piqueras
- Abstracts of the poster presentations 265
