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Contains the full text of the invited lectures and the abstracts of the poster contributions.
387 p., published by EMAS.

TABLE OF CONTENTS

-   Table of contents

-   Welcome Address from the Chairman of the Workshop                                                              5

-   EMAS President's Address                                                                                                                7

-   European Microbeam Analysis Society:    Executive Board                                                         9

                                                                       Sustaining Companies

-   International Scientific Committee                                                                                             13

    Local Organising Committee

-   Exhibitors                                                                                                                                    15

-   Sponsors                                                                                                                                      17

-   Workshop programme                                                                                                                 19

-   Tutorials                                                                                                                                      29

• The legacy of Raimond Castaing. 31

François Grillon and J. Philibert

• Improving matrix corrections. 41

David C. Joy

• EPMA present and future. 59

Glyn Love

• Electron microbeam analysis in the earth sciences. 77

John F.W. Bowles

• X-ray microanalysis of thin surface films and coatings. 89

Jean-Louis Pouchou

• Quantitative high-resolution electron microscopy.119

Dirk Van Dyck

• Investigations of the structure and properties of interfaces on the nanoscale.169

Manfred Rühle

• Ultra-shallow depth profiling by SIMS.171

Wilfried Vandervorst, H. De Witte, T. Janssens, C. Huygbaert and B. Brijs

• Nano-scale surface analysis by scanning probe ion mass spectrometry.173

Paul F.A. Alkemade and N.N. Gribov

• Examples of quantification in XPS.179

Thomas Gouder and L. Havela

• Monitoring the papermaking processes with XPS195

Leena-Sisko Johansson

• Analytical potential of EDS at low voltages.207

Edward D. Boyes

• Soft X-rays and low-voltage SEM in practice.225

Stefan Kuypers

• Benefits of spectrum simulation for X-ray microanalysis at low energies.247

Peter Duncumb and P.J. Statham

• Design features of a high-resolution microcalorimeter EDX system based on pulse tube and ADR cooling.251

Jens Höhne and U. Hess

• Energy-dispersive X-ray spectrometry by microcalorimetry for electron-excited X-ray microanalysis.263

Dale Newbury, D. Wollman, S.W. Nam, G. Hilton, K. Irwin, J. Small and J. Martinis

• Chemical interactions by LEXES.279

Christiane Bonnelle

-   Abstracts of presentations in the Young scientists’ session                                                       293

• Nb/Ta determination by electron microprobe in mantle xenoliths.

Florence Kalfoun, C. Merlet and D. Ionov

• Evaluation of CCD camera observed Kossel and pseudo-Kossel patterns by programme KOPSKO 2.

Enrico Langer, S. Däbritz and W. Hauffe

• Possibilities and limitations for organic dye detection at the surface of silver halide microcrystals with TOF-SIMS.

Jens Lenaerts, R. Gijbels, L. Van Vaeck, I. Geuens and P. Callant

• Particle analysis by SEM / EDXS and specimen damage.

Martin Schmied and P. Pölt

• Indirect measurement of biologically important compounds by means of X-ray microanalysis.

Gregorz Tylko, W. Kilarski and M. Mikrut

• Analysis of individual atmospheric particles by thin-window EPMA: optimisation of measuring conditions and applications.

Anna Worobiec, I. Szaloki, J. Osan and R. Van Grieken

-   Abstracts of the poster presentations                                                                                          301