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EMAS 1999 'Book of Abstracts' hardcopy

emas1999_boa_cover_small
60,00 € each

Price Member: EUR 42 each
Price Non-member: EUR 60 each

Contains the full text of the invited lectures and the abstracts of the poster contributions.
362 p., published by EMAS.

 

TABLE OF CONTENTS

-   Table of contents                                                                                                                           3

-   Welcome                                                                                                                                        5

-   Presidential                                                                                                                                     7

-   European Microbeam Analysis Society: Executive Board                                                              9

                                                         Sustaining Companies

-   International Scientific Committee                                                                                              13

    Local Organising Committee

-   Exhibitors                                                                                                                                    15

-   Sponsors                                                                                                                                     17

-   Detailed programme                                                                                                                    19

-   Tutorials                                                                                                                                      29

  • High-spatial-resolution low-energy electron beam X-ray microanalysis. 31

Ian Barkshire, Peter Karduck, Werner P. Rehbach and Silvia Richter

  • Quantitative trace analysis by wavelength-dispersive EPMA. 55

Stephen J.B. Reed

  • X-ray microanalysis in the environmental SEM: a challenge or a contradiction? 69

John F. Mansfield

  • Quantitative AES - Mapping and depth profiling. 85

Martin Prutton, David K. Wilkinson and Daniel A. Loveday

  • XPS imaging: principle and application in surface analysis107

Minh Duc Tran

  • Trends and tendencies in microbeam analysis.117

John J. Friel

  • Dynamic SIMS: quantification at all depths?119

Peer C. Zalm

  • High-resolution surface analysis by time-of-flight secondary ion mass spectrometry (TOF-SIMS).143

Birgit Hagenhoff

  • Quantitative energy-filtering transmission electron microscopy (EFTEM).165

Ferdinand Hofer, Werner Grogger, Peter Warbichler and Ilse Papst

  • Analysis of alloynanoparticles.187

Charles E. Lyman, Rollin E. Lakis and Bård Tøtdal

  • Application of microbeam techniques in the steel industry201

Henri Dillen, Chris Xhoffer, Hedwig Storms and Leo Kestens

  • Understanding the formation and history of rocks by applying microbeam analysis techniques.221

Luisa P. Ottolini

  • Application of microbeam techniques to materials problems in a service laboratory.241

Michael Kopnarski

  • Characterisation of defects in glasses and coatings on glasses by microanalytical techniques.255

Klaus Bange, Hartmut Müller and Christine Strubel

-   Abstracts of presentations in the Young scientists’ session                                                         273

  • A new method for determining the implanted charge in insulating materials under electron bombardment.

Mohamed Belhaj, S. Odof, O. Jbara and J. Cazaux

  • Expert system for WDS microprobe.

Cécile Fournier, C. Merlet, P. Staub and O. Dugne

  • Depth profiling of ion-implanted samples by LEXES and SIMS.

Chrystel Hombourger, P. Jonnard and C. Bonnelle

  • Calculations and measurements of L- and M-shell ionisation cross-sections by electron impact.

Xavier Llovet, C. Merlet, F. Salvat and J.M. Fernández-Varea

  • Comparative investigation of a heat-insulating coating on floatglass using AES, EPMA, SIMS and SNMS.

Markus Pidun, N. Lesch, S. Richter, P. Karduck, W. Bock, M. Kopnarski and P. Willich

  • Chemical surface characterisation of complex AgX microcrystals by imaging time‑of‑flight secondary ion mass spectrometry (TOF-SIMS).

Geert Verlinden, R. Gijbels and I. Geuens

-   Abstracts of the poster presentations                                                                                           281

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