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EMAS 1997 'Book of Abstracts' hardcopy

60,00 € each

Price Member: EUR 42 each
Price Non-member: EUR 60 each

Contains the full text of the invited lectures and the abstracts of the poster contributions.
375 p., published by EMAS.



-   Table of contents                                                                                                                           3

-   Welcome                                                                                                                                        5

-   Presidential                                                                                                                                     7

-   European Microbeam Analysis Society: Executive Board                                                              9

                                                                   Sustaining Companies

-   International Organizing Committee                                                                                            13

    Local organizing Committee

-   Exhibitors                                                                                                                                    15

-   Sponsors                                                                                                                                     17

-   Detailed programme                                                                                                                    19

-   Tutorials                                                                                                                                      25

  • Standardless analysis. 27

Johann Wernisch

  • EPMA techniques for quantitative near-surface microanalysis and depth profiling. 39

Peter Karduck

  • Matrix corrections in AES and XPS. 65

Alexander G. Fitzgerald

  • X-ray analysis and imaging using low voltage electron beams 89

Edward D. Boyes

  • SPM and near-field microscopies.105

Mark E. Welland

  • EPMA of frozen biological bulk samples.111

Alan T. Marshall

  • Environmental scanning electron microscopy and X-ray microanalysis of biological materials.129

David C. Sigee

  • Quantitative elemental mapping of X-ray radiographs by factorial analysis of correspondence.149

Pierre Trebbia

  • X-ray spectrum processing and multivariate analysis.175

John Titchmarsh

  • Thin film analysis and chemical mapping in the analytical electron microscope.195

David B. Williams, M. Watanabe and D.T. Carpenter

  • Wavelength dispersive X-ray spectrometry.213

Stephen J.B. Reed

  • High resolution non-dispersive X-ray spectroscopy with state-of-the-art silicon detectors.229

Lothar Strüder

  • Recent developments in instrumentation for X-ray microanalysis.245

Peter J. Statham

-   Abstracts of presentations in the Young scientists’ session                                                         261

  • Effect of the sputter cleaning process on the substrate in reactive cathodic arc evaporation.

Maureen MacKenzie, A.J. Craven, W.A.P. Nicholson and P. Hatto

  • EPMA sputter depth profiling: part I: experiment.

Norbert Lesch, S. Richter and P. Karduck

  • Measurement of the relative intensities of the Lα/Lβ line using tilted specimen in EPMA: the titanium example.

Béatrice Schneider and C. Merlet

  • EPMA study of rare earth element distributions among mineral phases in zirconolite-rich ceramic for high level waste fixation.

Anton I. Yakushev and O.A. Knyazev

  • Magnesium in the heart: quantitative microanalysis studies of intracellular distribution.

Andrew D. Johnson, W.A.P. Nicholson, H.Y. Elder and J.A.S. McGuigan

  • Impurity segregation at microfacetted boundaries.

Uwe Alber, H. Müllejans and M. Rühle

-   Abstracts of the poster presentations                                                                                           269

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