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Contains the full text of the invited lectures and the abstracts of the poster contributions.
375 p., published by EMAS.

TABLE OF CONTENTS

-   Table of contents                                                                                                                           3

-   Welcome                                                                                                                                        5

-   Presidential                                                                                                                                     7

-   European Microbeam Analysis Society: Executive Board                                                              9

                                                                   Sustaining Companies

-   International Organizing Committee                                                                                            13

    Local organizing Committee

-   Exhibitors                                                                                                                                    15

-   Sponsors                                                                                                                                     17

-   Detailed programme                                                                                                                    19

-   Tutorials                                                                                                                                      25

• Standardless analysis. 27

Johann Wernisch

• EPMA techniques for quantitative near-surface microanalysis and depth profiling. 39

Peter Karduck

• Matrix corrections in AES and XPS. 65

Alexander G. Fitzgerald

• X-ray analysis and imaging using low voltage electron beams 89

Edward D. Boyes

• SPM and near-field microscopies.105

Mark E. Welland

• EPMA of frozen biological bulk samples.111

Alan T. Marshall

• Environmental scanning electron microscopy and X-ray microanalysis of biological materials.129

David C. Sigee

• Quantitative elemental mapping of X-ray radiographs by factorial analysis of correspondence.149

Pierre Trebbia

• X-ray spectrum processing and multivariate analysis.175

John Titchmarsh

• Thin film analysis and chemical mapping in the analytical electron microscope.195

David B. Williams, M. Watanabe and D.T. Carpenter

• Wavelength dispersive X-ray spectrometry.213

Stephen J.B. Reed

• High resolution non-dispersive X-ray spectroscopy with state-of-the-art silicon detectors.229

Lothar Strüder

• Recent developments in instrumentation for X-ray microanalysis.245

Peter J. Statham

-   Abstracts of presentations in the Young scientists’ session                                                         261

• Effect of the sputter cleaning process on the substrate in reactive cathodic arc evaporation.

Maureen MacKenzie, A.J. Craven, W.A.P. Nicholson and P. Hatto

• EPMA sputter depth profiling: part I: experiment.

Norbert Lesch, S. Richter and P. Karduck

• Measurement of the relative intensities of the Lα/Lβ line using tilted specimen in EPMA: the titanium example.

Béatrice Schneider and C. Merlet

• EPMA study of rare earth element distributions among mineral phases in zirconolite-rich ceramic for high level waste fixation.

Anton I. Yakushev and O.A. Knyazev

• Magnesium in the heart: quantitative microanalysis studies of intracellular distribution.

Andrew D. Johnson, W.A.P. Nicholson, H.Y. Elder and J.A.S. McGuigan

• Impurity segregation at microfacetted boundaries.

Uwe Alber, H. Müllejans and M. Rühle

-   Abstracts of the poster presentations                                                                                           269