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EMAS 1995 'Book of Abstracts' hardcopy

emas1995_boa_cover_small
60,00 € each

Price Member: EUR 42 each
Price Non-member: EUR 60 each

Contains the full text of the invited lectures and the abstracts of the poster contributions.
430 p., published by EMAS.

 

TABLE OF CONTENTS

-   Table of contents                                                                                                                           3

-   Welcome                                                                                                                                        5

-   Presidential                                                                                                                                     7

-   European Microbeam Analysis Society: Executive Board                                                              9

                                                                  International Advisory Board

                                                                   Sustaining Companies

-   International Organizing Committee                                                                                            15

    Local organizing Committee

-   Exhibitors                                                                                                                                    17

-   Sponsors                                                                                                                                     21

-   Detailed programme                                                                                                                    23

-   Tutorials                                                                                                                                      29

  • Monte Carlo simulation techniques for quantitative X-ray microanalysis. 31

Ludwig Reimer

  • Transport equation approach to electron beam microanalysis: fundamentals. 47

Wolfgang S.M. Werner

  • Use of soft X-rays in microanalysis. 95

Jean-Louis Pouchou

  • Intensity measurement of wavelength dispersive X-ray emission bands: applications to the soft X-ray region.117

Guy Rémond, C. Gilles, M. Fialin, O. Rouer, R. Marinenko, R. Myklebust and D. Newbury

  • Synchrotron radiation induced X-ray fluorescence analysis: tutorial.151

Koen Janssens, L. Vincze, B. Vekemans, A. Aerts, F. Adams, K.W. Jones and A. Knöchel

  • Particle-induced X-ray emission – a quantitative technique suitable for microanalysis.189

Klas Malmqvist

  • Cathodoluminescnece microscopy and spectroscopy of semiconductors and wide bandgap insulating materials.213

Jean-François Bresse, G. Rémond and B. Akamatsu

  • Time-of-flight secondary ion mass spectrometry.255

Patrick Bertrand

  • Dynamic secondary ion mass spectrometry.275

Georges Slodzian

  • Three-dimensional nanoanalysis with the tomographic atom probe.277

Didier Blavette, A. Bigot, C. Schmuck, F. Danoix and P. Auger

  • Scanning probe microscopy.299

James K. Gimzewski

  • Microanalysis at atomic resolution.301

Steve J. Pennycook, N.D. Browning, M.M. McGibbon, A.J. McGibbon, D.E. Jesson and M.F. Chisholm

-   Abstracts of the poster presentations  321

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