Price Member: EUR 42 each
Price Non-member: EUR 60 each
Contains the full text of the invited lectures and the abstracts of the poster contributions.
430 p., published by EMAS.
TABLE OF CONTENTS
- Table of contents 3
- Welcome 5
- Presidential 7
- European Microbeam Analysis Society: Executive Board 9
International Advisory Board
Sustaining Companies
- International Organizing Committee 15
Local organizing Committee
- Exhibitors 17
- Sponsors 21
- Detailed programme 23
- Tutorials 29
- Monte Carlo simulation techniques for quantitative X-ray microanalysis. 31
Ludwig Reimer
- Transport equation approach to electron beam microanalysis: fundamentals. 47
Wolfgang S.M. Werner
- Use of soft X-rays in microanalysis. 95
Jean-Louis Pouchou
- Intensity measurement of wavelength dispersive X-ray emission bands: applications to the soft X-ray region.117
Guy Rémond, C. Gilles, M. Fialin, O. Rouer, R. Marinenko, R. Myklebust and D. Newbury
- Synchrotron radiation induced X-ray fluorescence analysis: tutorial.151
Koen Janssens, L. Vincze, B. Vekemans, A. Aerts, F. Adams, K.W. Jones and A. Knöchel
- Particle-induced X-ray emission – a quantitative technique suitable for microanalysis.189
Klas Malmqvist
- Cathodoluminescnece microscopy and spectroscopy of semiconductors and wide bandgap insulating materials.213
Jean-François Bresse, G. Rémond and B. Akamatsu
- Time-of-flight secondary ion mass spectrometry.255
Patrick Bertrand
- Dynamic secondary ion mass spectrometry.275
Georges Slodzian
- Three-dimensional nanoanalysis with the tomographic atom probe.277
Didier Blavette, A. Bigot, C. Schmuck, F. Danoix and P. Auger
- Scanning probe microscopy.299
James K. Gimzewski
- Microanalysis at atomic resolution.301
Steve J. Pennycook, N.D. Browning, M.M. McGibbon, A.J. McGibbon, D.E. Jesson and M.F. Chisholm
- Abstracts of the poster presentations 321
