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EMAS 1993 'Book of Abstracts' hardcopy

60,00 € each

Price Member: EUR 42 each
Price Non-member: EUR 60 each

Contains the full text of the invited lectures and the abstracts of the poster contributions.
278 p., published by EMAS.



-   Table of contents                                                                                                                           3

-   Welcome                                                                                                                                        5

-   Presidential                                                                                                                                     7

-   European Microbeam Analysis Society: Executive Board                                                              9

                                                                  International Advisory Board

                                                                   Sustaining Companies

-   International Organizing Committee                                                                                            13

    Local organizing Committee

-   Exhibitors                                                                                                                                    15

-   Sponsors                                                                                                                                     17

-   Detailed programme                                                                                                                    19

-   Tutorials                                                                                                                                      21

  • Correction procedures in electron probe microanalysis of bulk samples. 25

Peter Duncumb

  • Recent progress in quantitative and high resolution AES. 45

Siegfried Hoffmann

  • Standardless X-ray analysis of bulk specimens. 67

Jean-Louis Pouchou

  • Standardless quantitation of thin film specimens. 85

W.A. Patrick Nicholson

  • Electron energy loss spectroscopy mapping.105

Christian Colliex, M. Tencé, E. Lefèvre, C. Mory, H. Gu, D. Bouchet and C. Jeanguillaume

  • Quantitative analysis of films by ion microbeam methods. I: RBS, channeling and NRA.123

Antonio V. Drigo

  • Quantitative analysis of thin films by SIMS.151

Helmut W. Werner

  • Quantitative microbeam analysis of particles.175

Pierre Van Espen

  • Environmental scanning electron microscopy and microanalysis.177

Gerasimos D. Danilatos

-   Abstracts of the poster presentations                                                                                           191

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