PROCEEDINGS OF THE EMAS 2011 EUROPEAN WORKSHOP

12th European Workshop in Angers, France

IOP Conf. Ser.: Mater. Sci. Eng.  (2012)  32  [doi: 10.1088/1757-899X/32/]

Edited by: J.L. Lábár, C.T. Walker, F. Brisset, O. Dugne and F. Robaut

          This volume of the IOP Conference Series: Materials Science and Engineering contains papers from the 12th Workshop of the European Microbeam Analysis Society (EMAS) on Modern Developments and Applications in Microbeam Analysis which took place from the 15th to the 19th of May 2011 in the Angers Congress Centre, Angers, France.

          The primary aim of this series of workshops is to assess the state-of-the-art and reliability of microbeam analysis techniques.  The workshops also provide a forum where students and young scientists starting out on a career in microbeam analysis can meet and discuss with the established experts.  The workshops have a very specific format comprising invited plenary lectures by internationally recognized experts, poster presentations by the participants and round table discussions on the key topics led by specialists in the field.  This workshop was organized in collaboration with GN-MEBA – Groupement National de Microscopie Electronique à Balayage et de microAnalysis, France.  The technical programme included the following topics: the limits of EPMA, new techniques, developments and concepts in microanalysis, microanalysis in the SEM, and new and less common applications of micro- and nanoanalysis.

          As at previous workshops there was also a special oral session for young scientists.  The best presentation by a young scientist was awarded with an invitation to attend the 2012 Microscopy and Microanalysis meeting at Phoenix, Arizona.  The prize went to Pierre Burdet, of the Federal Institute of Technology of Lausanne (EPFL), for his talk entitled “3D EDS microanalysis by FIB-SEM: enhancement of elemental quantification”.

          The continuing relevance of the EMAS workshops and the high regard in which they are held internationally can be seen from the fact that 74 posters from 18 countries were on display at the meeting and that the participants came from as far away as Japan, Canada and the USA.  A selection of participants with posters was invited to give a short oral presentation of their work in three dedicated sessions.  The prize for the best poster was an invitation to participate in the 22nd Australian Conference on Microscopy and Microanalysis (ACMM 22) at Perth, Western Australia.  The prize was awarded to G. Samardzija of the Jozef Stefan Institute, Ljubljana, for the poster entitled: “EPMA-WDS quantitative compositional analysis of barium titanate ceramics doped with cerium”.

          This proceedings volume contains the full texts of 5 of the invited plenary lectures and of 23 papers on related topics originating from the posters presented at the workshop.  All the papers have been subjected to peer review by a least two referees.

Acknowledgements

          On behalf of the European Microbeam Analysis Society I would like to thank all the invited speakers, session chairs and members of the discussion panels for making the meeting such a great success.  Special thanks go to François Brisset and Luc Van’t dack who directed the organisation of the workshop giving freely of their time and talents.  As was the case for previous workshops, the EMAS board in corpore was responsible for the scientific programme.  The technical exhibition, which occupied 130 sq.m of floor space, was outstanding.  It was very encouraging to see new instruments on display, including a FEG electron microprobe as a first worldwide presentation.  Moreover, almost all the companies that exhibited provided financial support, either by sponsoring an event or by advertising.

          Below, in alphabetical order, is a list of exhibiting companies and sponsors of the workshop.

• Ametek GmbH, Edax Business Unit
• Bruker Nano GmbH
• Cameca
• Carl Zeiss NTS
• Commissariat à l'Energie Atomique
• European Institute for Transuranium Elements (Germany)
• Elexience
• FEI Company
• Fondis Electronic SA
• Gatan (France)
• GN-MEBA
• Jeol (Europe) SAS
• L’Oréal, Direction Générale Recherche et Innovation
• NanoMEGAS sprl
• Oxford Instruments SAS
• Probe Software, Inc.
• SAMx
• Target-Messtechnik
• Thermo Fisher Scientific

Clive T Walker

EMAS President

Table of contents (manuscript no. in bold)

- Chemical characterisation of scale formation of high manganese steels (Fe-Mn23-C0.6) on the sub-micrometre scale: a challenge for EPMA
       E Augustyn, B Hallstedt, B Wietbrock, J Mayer, A Schwedt and S Richter    012001

- Microstructure and mechanical properties of nanocrystalline Ni-Mo protective coatings
       A Bigos, E Beltowska-Lehman and P Indyka    012002

         - Characterisation of high temperature refractory ceramics for nuclear applications
       P D W Bottomley, Th Wiss, A Janssen, B Cremer, H Thiele, D Manara, M Scheindlin, M Murray-Farthing, P Lajarge, M Menna, D Bouexière and V V Rondinella    012003

    - Using a controlled pressure field emission gun scanning electron microscope to acquire EBSD data on non-conductive samples

           F Brisset    012004

         - Prototypic corium analysis: a round robin for SEM and EDS characterisation
       L Brissonneau, C Journeau, P Piluso, M Kiselova, S Bakardjieva, T Wiss, P W D Bottomley and H Thiele    012005

- Application of EBSD method for the investigation of microstructure and crystallographic orientation in RE₂Zr₂O₇ TBC
         B Chmiela, M Sozańska and G Moskal    012006

- SEM-EDS analysis of ancient gold leaf glass mosaic tessarae.  A contribution to the dating of the materials
         A Conventi, E Neri and M Verità    012007

- Smart pile-up consideration for evaluation of high count rate EDS spectra
         F Eggert, T Elam, R Anderhalt and J Nicolosi    012008

- Contribution of EPMA to airborne pollen analysis
         F Guimarães, L Duque, H Ribeiro, R Sousa and I Abreu    012009

- Microstructural characterisation of electrodeposited coatings of metal matrix composite with alumina nanoparticles
          P Indyka, E Beltowska-Lehman and A Bigos    012010

- The application of VP-ESEM in microstructure analysis of ceramic macroporous scaffolds for bone tissue engineering
          A M Janus and M Faryna    012011

    - Trace analysis in EPMA
          M J Jercinovic, M L Williams, J Allaz and J J Donovan    012012
- X-ray microanalysis of volcanic ash
          S L Kearns and B Buse    012013

- An inter-laboratory comparison of EPMA analysis of alloy steel at low voltage
          X Llovet, E Heikinheimo, A Núñez Galindo, C Merlet, J F Almagro Bello, S Richter, J Fournelle and C J G van Hoek    012014

- X-ray microanalysis: the state of the art of SDD detectors and WDS systems on scanning electron microscopes (SEM)
          L Maniguet, F Robaut, A Meuris, F Roussel-Dherbey and F Charlot    012015

- Uncertainty and capability of quantitative EPMA at low voltage - a review
          C Merlet and X Llovet    012016

- Experimental check of the use of unconventional reference materials for EDS analysis in a TEM by extrapolation method based on pure elements
           M Nacucchi, M Alvisi, D Altamura, V Pfister, D Valerini, D Mello and C Giannini    012017

- EPMA and EBSD analysis of the chemical and structural changes in 16 wt% chromium stainless steel during deformation
          A Núñez Galindo, X Llovet and J F Almagro Bello    012018

- Effect of TiN nano-coating on the interface microstructure of carbon fibres-AZ91 alloy composite
          A Olszówka-Myalska and A Botor-Probierz    012019

- A geochemical investigation of trace elements in well RN-17 at Reykjanes geothermal system, SW-Iceland
          L P Ottolini, N Raffone, G Ó Fridleifsson, S Tonarini, M D’Orazio and G Gianelli    012020

- Combining trace elements micro-analysis in deposited dredged sediments: EPMA and μ-XRF analysis
          A Poitevin, C Lerouge, G Wille, P Bataillard, P. Quinn and L Hennet    012021

- Shielded field emission EPMA for microanalysis of radioactive materials
          R Restani and A Wälchli    012022

- Measurement of palladium crust thickness on catalyst by EPMA
           L Sorbier, A-S Gay, A Fécant, M Moreaud and N Brodusch    012023

- Systematic discrepancies in Monte Carlo predictions of k-ratios emitted from thin films on substrates
          P Statham, X Llovet and P Duncumb    012024

- EBSD study of the microstructure evolution in a commercially pure aluminium severely deformed by ECAP
          B Tolaminejad, F Brisset and T Baudin    012025

-  Geometry correction procedure for quantitative X-ray microanalysis of low Z number matrices
          G Tylko    012026

-  Mineral surface - organic matter interactions: basics and applications
          G Valdrè, D Moro and G Ulian    012027

-  Microbeam analysis of irradiated nuclear fuel
          C T Walker, S Brémier, P Pöml, D Papaioannou and P W D Bottomley    012028