PROCEEDINGS OF THE EMAS 2007 EUROPEAN WORKSHOP

10th European Workshop in Antwerp, Belgium

Mikrochimica Acta, vol. 161, nos. 3-4, p. 285-483 (2008)

Edited by: L. Van't dack, R. Gijbels and C.T. Walker

          This special issue of Microchimica Acta contains papers from the 10th workshop of the European Microbeam analysis Society (EMAS) on Modern Developments and Applications in Microbeam Analysis which took place from the 6th to the 10th of May 2007 in the Congress Centre ‘t Elzenveld, Antwerp, Belgium.  The primary aim of this series of workshops is to assess the state-of-the-art and reliability of microbeam analysis techniques.  The workshops also provide a forum where students and young scientists starting out on career in microbeam analysis can meet and discuss with the established experts.  The workshops have a very distinct format comprising invited plenary lectures by internationally recognized experts, poster presentations by the participants and round table discussions on the key topics led by the specialists in the field.  For this workshop EMAS invited speakers on the following leading edge topics: multilayer crystals for light element analysis, parallel-beam wavelength-dispersive analysis, applications of FIB SIMS in materials science, fundamentals and applications of cluster SIMS, tomographical spectral imaging, recent trends and applications in EELS, model-based quantification in EELS, the impact of aberration-correction on analytical TEM, application of sub-Ångstrom and sub-eV analytical TEM in materials science, advances in synchrotron X-ray fluorescence spectro-microcopy, X-ray fluorescence analysis in the scanning electron microscope, 3D µ-X-ray fluorescence spectroscopy, microbeam analysis applied to adhesion, surfaces and interfaces, applications of microbeam analysis in the cultural heritage field, chemical and structural characterization of fine particles by a combination of EPMA and µ-Raman spectroscopy, and forensic applications of microbeam analysis.

          The continuing relevance of the EMAS workshops and the high regards in which they are held internationally can be seen from the fact that 77 posters from 20 countries were on display at the meeting and that the participants came from as far away as Australia, Brazil, Canada, Japan, South Africa and the USA.  A selection of participants with posters were invited to give a short oral presentation of their work in two dedicated sessions.   As at previous workshops there was also a special oral session for young scientists.  Small cash prizes were awarded for the three best posters and for the best oral presentation by a young scientist.  The prize for the best poster went to Enrico Langer from the Institut für Festkörperphysik of the Technische Universität Dresden, Germany for “First X-ray fluorescence excited Kossel diffraction in the SEM by a compact X-ray tube and focusing polycapillary lens” and the prize for the best oral presentation by a young scientist was awarded to Sandra Van Aert from the Department of Physics, EMAT, of the University of Antwerp, Belgium.

          This proceedings volume contains the full texts of 6 of the invited plenary lectures and of 25 papers on related topics originating from the posters presented at the workshop.  All the papers have been subjected to peer review by a least two referees.  The proceedings of all previous EMAS workshops were also published either as a special issue or a supplement to Microchimica Acta.  Undoubtly, as with the others in the series, the present volume will form a key source of reference for scientists and technicians using microbeam analysis techniques.

Table of contents - vol. 161, nos. 3-4

- Conventional wavelength-dispersive spectroscopy versus parallel beam spectroscopy - a basic overview.

    C. van Hoek and M. Koolwijk     287

- Applications of microanalysis in the cultural heritage field.

    I. Joosten     295

- Micro X-ray fluorescence as a potential technique to monitor in-situ air pollution.

    E. Bontempi, R. Bertuzzi, E. Ferretti, M. Zucca, P. Apostoli, S. Tenini and L.E. Depero     301

- A SIMS study of lithium, boron and chlorine in basalts from Reykjanes (Southwestern Iceland).

    N. Raffone, L.P. Ottolini, S. Tonarini, G. Gianelli and G.Ó. Fridleifsson     307

- Combined cathodoluminescence spectroscopy, electron microprobe and laser ablation ICP mass spectrometry analysis: an attempt to correlate luminescence and chemical composition on monazite.

    G. Vaggelli, R. Cossio, M. Petrelli and P. Rossetti     313

- Soluble fraction of stabilising elements in ferritic stainless steel.

    J.F. Almagro, X. Llovet, M.A. Heredia, C. Luna and R. Sánchez     323

- SIMS analysis of chlorine in metasomatized upper-mantle rocks.

    L.P. Ottolini and B. Le Fèvre     329

- Improvements in trace element detection in energy-dispersive spectrometry using an X-ray filter (FEDS) and applications to petrological problems.

    R. Cossio, G. Vaggelli and A. Borghi     337

- Light elements microanalysis of steel/B4C melts for nuclear power plants accident studies.

    S. Sao Joao, C. Duriez, C. Dominguez and D. Jacquemain     343

- Chemical and microstructural characterization of natural hydroxyapatite derived from pig bones.

    A.M. Janus, M. Faryna, K. Haberko, A. Rakowska and T. Panz      349

- Study of structural material resulting from the nuclear fuel cycle using SEM-WDX, EPMA and SIMS techniques.

    J. Lamontagne, C. Eysseric, L. Desgranges, C. Valot, J. Noirot, T. Blay, I. Roure and B. Pasquet     355

- Van Gogh's painting grounds: an examination of barium sulphate extender using analytical electron microscopy - SEM/FIB/TEM/EDX.

    R. Haswell, U. Zeile and K. Mensch     363

- Investigation of InxGa_1-xN layers by local methods.

    Y.V. Domracheva, L.A. Bakaleinikov, E.Y. Flegontova, V.N. Jmerik and T.B. Popova     371

- Volume and composition surface changes in alkali silicate glass irradiated with electrons.

    K. Jurek and O. Gedeon     377

- Combined SEM-EDX and µ-Raman spectroscopy for the characterisation of glass/Al-rich refractory interfaces.

    R. Falcone, P. Galinetto, B. Messiga, E. Negri, M.P. Riccardi, G. Sommariva and M. Verità     381

- Applications of focussed ion beam SIMS in materials science.

    D.S. McPhail, R.J. Chater and L. Li     387

- New model ultra-soft X-ray spectrometer for microanalysis.

    S. Fukushima, T. Kimura, T. Ogiwara, K. Tsukamoto, T. Tazawa and S. Tanuma     399

- Application of EPMA and analytical TEM to brazed metal-supported catalytic converters.

    S. Richter, H. Bode, A. Dimyati and J. Mayer     405

- X-ray fluorescence as an additional analytical method for a scanning electron microscope.

    M. Procop     413

- Block lift-out sample preparation for 3D experiments in a dual beam FIB.

    M. Schaffer and J. Wagner     421

- Virtual standard for wavelength-dispersive electron-probe microanalysis.

    C. Merlet, X. Llovet, O. Dugne, S. Brémier, W. Van Renterghem and R. Restani     427

- Multilayers for light element electron probe microanalysis.

    S.J.B. Reed     433

- Model-based quantification of EELS: is standardless quantification possible?

    J. Verbeeck and G. Bertoni     439

- Electron beam and Mossbauer techniques combined to optimise base metal partitioning in the furnace.

    L. Andrews, C. Pistorius and F. Waanders     445

- Analysis of ultra light elements with newly developed ultra-soft X-ray spectrometer for electron probe microanalysis.

    T. Ogiwara, T. Kimura, S. Fukushima, K. Tsukamoto, T. Tazawa and S. Tanuma     451

- First X-ray fluorescence excited Kossel diffraction in the SEM.

    E. Langer, S. Däbritz and M. Haschke     455

- Monte Carlo calculations in X-ray microanalysis of epitaxial layers.

    T.B. Popova, E.Y. Flegontova, L.A. Bakaleinikov and M.V. Zamoryanskaya     459

- Application of EPMA and XRF for the investigation of particulate pollutants in the field of cultural heritage.

    V. Kontozova-Deutsch, F. Deutsch, R.H.M. Godoi, Z. Spolnik, W. Wei and R. Van Grieken     465

- About the N-series X-ray lines in the electron excited spectra of heavy elements.

    A. Scheffel, J. Dellith and M. Wendt      471

- The M emission spectra of the heavy rare earth elements 67<Z<71.

    J. Dellith and M. Wendt     475

- An investigation of the relative sensitivity factor for the quantification of ion microprobe results for neodymium isotopes in SIMFUEL.

    S. Portier, S. Bremier, R. Hasnaoui, O. Bildstein and C.T. Walker     479