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PROCEEDINGS OF THE EMAS 2005 EUROPEAN WORKSHOP
9th European Workshop in Florence, Italy
Mikrochimica Acta, vol. 155, nos. 1-2, p. 1-326 (2006)
Edited by: R. Rinaldi, A. Armigliato, A.P. Santo, G. Vaggelli, C.T. Walker, G.F. Bastin and R. Gauvin
This special issue of Microchimica Acta collects papers of the original works presented at the 9th Workshop of the European Microbeam Analysis Society held in conjunction with the 3rd Meeting of the International Union of Microbeam Analysis Societies, on the subject of “Modern Developments and Applications in Microbeam Analysis”, at the “Convitto della Calza” congress centre in Florence, Italy from the 18th to the 26th of May 2005. The very special occasion of the first combined EMAS Workshop - IUMAS Meeting gave the workshop the widest audience on record with participants from all over the world.
The primary aim of the meeting was to assess the state of the art and reliability of microbeam analysis techniques. The workshop was organized within the usual EMAS format consisting of invited tutorials and round-table discussions led by experts in the field. All other contributions were hosted in the form of poster presentations to which ample time was given in the scientific programme. A number of poster presenters were also given the opportunity of a brief oral presentation based on a selection notified to the authors with the acceptance of their poster contribution. Brief presentations and contributions to the round table discussions were encouraged also based on the results of a questionnaire circulated well in advance before the meeting among all prospective participants. This provided everyone with an opportunity to actively contribute to the discussion. The format was therefore aimed at maximising the transfer of knowledge among the participants. The programme included a comprehensive exhibition of the latest analytical equipment which allowed fruitful exchanges between scientists and manufacturers of scientific equipment. Participation of young scientists (under 30 years of age) received special attention with one dedicated oral session and several forms of economic support, from participation bursaries to small cash prizes and awards, issued by ad hoc committees of the Society’s officers and members.
Recipients of the bursaries for the "Young Scientist Session" were: K. Robertson (McGill Univ., CDN), M. Massi (Florence Univ. IT), K. McBean (Univ. Technol. Sydney, AUS), R. White (Univ. Technol. Sydney, AUS), A. Assmann (Univ. Jena, DE), and V. Van der Linden (Univ. Antwerp, BE); the award for the best oral presentation by a young scientist went to M. Massi. Silvia Richter (RWTH, Aachen, DE) received the award for the best poster for the second time running. Furthermore, EMAS-IUMAS grants were awarded to 17 students and young researchers to defray some of the expenses for participation to the workshop.
Table of contents – vol. 145, nos. 1-4
- Imaging single atoms with Z-contrast scanning transmission electron microscopy in two and three dimensions.
P.M. Voyles 5
- Atomic level characterization based on focus modulation electron microscopy.
Y. Takai, M. Taya, H. Chikada and Y. Rimura 11
- Orientation imaging microscopy for the transmission electron microscope.
D.J. Dingley 19
- Advances in electron backscatter diffraction for the characterization of interfaces.
V. Randle 31
- Imaging and microanalysis in environmental scanning electron microscopy.
B.L. Thiel 39
- ESEM applications: from cultural heritage conservation to nano-behaviour.
E. Doehne 45
- Cathodoluminescence microscopy and spectroscopy of opto-electronic materials.
M.R. Phillips 51
- Quantitative bulk and trace element X-ray mapping using multiple detectors.
K. Moran and R. Wuhrer 59
- Monte Carlo simulation in electron probe microanalysis. Comparison of different simulation algorithms.
F. Salvat, X. Llovet, J.M. Fernández-Varea and J. Sempau 67
- Quantitative X-ray microanalysis of heterogeneous materials using Monte Carlo simulations.
R. Gauvin 75
- Electron excited L X-ray spectra of the elements 14 ≤ Z ≤ 22.
A. Assmann, J. Dellith and M. Wendt 83
- Electron excited L X-ray spectra of the elements 24 ≤ Z ≤ 33.
A. Assmann, J. Dellith and M. Wendt 87
- Microanalysis of hydrogen, boron and fluorine in vesuvianite by means of SIMS, EPMA and FTIR.
F. Bellatreccia, L. Ottolini and G. Della Ventura 91
- Assessment of inorganic fibre burden in biological samples by scanning electron microscopy – energy dispersive spectroscopy.
E. Belluso, D. Bellis, E. Foriero, S. Capella, G. Ferraris and S. Coverlizza 95
- Laboratory microbeam analysis applied to cultural heritage studies.
D. Benedetti, I. Alessandri, P. Bergese, E. Bontempi, P. Colombi, D. Garipoli, R. Pedrazzani, P. Zangola and L.E. Depero 101
- Yttrium geothermometry applied to garnets from different metamorphic grades analysed by EPMA and µ-PIXE techniques.
A. Borghi, R. Compagnoni, R. Cossio, L. Giuntini, M. Massi, F. Olmi, A.P. Santo and G. Vaggelli 105
- Installation of a shielded SIMS for the analysis of irradiated nuclear fuels.
S. Brémier, R. Hasnaoui, S. Portier, O. Bildstein and C.T. Walker 113
- The blue pigment used in Vallemaggia (Switzerland) in the half of 19th century by painters Vanoni and Pedrazzi.
G. Cavallo 121
- Accurate determination of trace amounts of oxygen in CrAlN hard coatings by a combination of WD-EPMA and SIMS.
S. Dreer, P. Wilhartitz, B. Sartory, R. Tessadri, K. Piplits and K.E. Mayerhofer 125
- EDX-spectra simulation in electron probe microanalysis optimization of excitation conditions and detection limits.
F. Eggert 129
- WDXRF, EPMA and SEM/EDX quantitative chemical analyses of small glass samples.
R. Falcone, G. Sommariva and M. Verità 137
- The valence state analysis of Ti in FeTiO3 by soft X-ray spectroscopy.
S. Fukushima, T. Kimura, K. Nishida, V.A. Mihai, H. Yoshikawa, M. Kimura, T. Fujii, H. Oohashi, Y. Ito and M. Yamashita 141
- Microanalysis of glass surfaces after thermal exposure.
O. Gedeon and K. Jurek 147
- Advanced X-ray laboratory microbeam techniques applied to metallurgy.
M. Gelfi, E. Bontempi, G. Cornacchia, R. Roberti and L.E. Depero 151
- Low voltage contrast with an SEM transmission electron detector.
F. Grillon 157
- Van Gogh’s painting grounds: quantitative determination of bulking agents (extenders) using SEM/EDX.
R. Haswell, L. Carlyle and K.T.J. Mensch 163
- Microanalysis on Hallstatt textiles: colour and condition.
I. Joosten, M.R. van Bommel, R. Hofmann-de Keijzer and H. Reschreiter 169
- Spatial resolution of a wavelength-dispersive electron probe microanalyzer equipped with a thermal field emission gun.
T. Kimura, K. Nishida and S. Tanuma 175
- EPMA investigation of Roman coin silvering techniques.
G. Kraft, S. Flege, F. Reiff, H.M. Ortner and W. Ensinger 179
- Fission gas bubbles characterisation in irradiated UO2 fuel by SEM, EPMA and SIMS.
J. Lamontagne, L. Desgranges, C. Valot, J. Noirot, T. Blay, I. Roure and B. Pasquet 183
- Preparation of reference glasses for in-situ analysis of lithium and boron.
B. Le Fevre and L Ottolini 189
- Electron probe microanalysis of HfO2 thin films on conductive and insulating substrates.
M. Lulla, J. Asari, J. Aarik, K. Kukli, R. Rammula, U. Tapper, E. Kauppinen and V. Sammelselg 195
- Absolute determination of characteristic X-ray yields with a wavelength-dispersive spectrometer.
C. Merlet and X. Llovet 199
- Influence of second-order lines on the quantitative wavelength dispersive spectrometry analysis at low accelerating voltages.
V. Mikli 205
- X-ray mapping and interpretation of scatter diagrams.
K. Moran and R. Wuhrer 209
- Shave-off depth profiling for nano-devices.
M. Nojima, M. Toi, A. Maekawa, T. Yamamoto, T. Sakamoto, M. Owari and Y. Nihei 219
- Direct visualization of electromagnetic microfields by superposition of two kinds of electron holograms.
A. Ohshita, M. Okuhara, C. Matsuya, K Hata and K. Iida 225
- Strategies for quantification of light elements in minerals by SIMS: H, B and F.
L. Ottolini, F. Cámara and F.C. Hawthorne 229
- New orientation formation during recrystallization of cold deformed, high symmetry aluminium bicrystals.
H. Paul and J. Driver 235
- Orientation imaging in scanning electron and transmission electron microscopy for characterization of the shear banding phenomenon.
H. Paul, A. Morawiec, E. Bouzy, J.-J. Fundenberger and A. Piatkowski 243
- Light-lithophile element metasomatism of Finero peridotite (W. Alps): a secondary-ion mass spectrometry study.
N. Raffone, B. Le Fevre, L. Ottolini, R. Vannucci and A. Zanetti 251
- A new method to examine interfacial reactions of a multilayered system NiAl‑Hf‑hBN on a sapphire fibre.
S. Richter, S. Kyrsta, J. Schneider, D. Hajas and J. Mayer 257
- External micro-PIXE measurements: preliminary results on volcanic rocks from Nyiragongo Volcano.
A.P. Santo, M. Fedi, L. Giuntini, P.A. Mandó, M. Massi and F. Taccetti 263
- The L spectrum of Fe and Fe3O4.
A. Scheffel, A. Assmann, J. Dellith and M. Wendt 269
- Detector calibration and measurement of fundamental parameters for X-ray spectrometry.
F. Scholze, B. Beckhoff, M. Kolbe, M. Krumrey, M. Müller and G. Ulm 275
- Comparison of 3D surface reconstruction data from certified depth standards obtained by SEM and an infinite focus measurement machine (IFM).
H. Schroettner, M. Schmied and S. Scherrer 279
- Electrically cooled SiLi detectors for application in X-ray equipment.
A. Sokolov, A. Pchelintsev, A. Loupilov and V. Gostilo 285
- Pile-up correction for improved accuracy and speed of X-ray analysis.
P.J. Statham 289
- A new method of surface preparation for high spatial resolution EPMA/SEM with an argon ion beam.
H. Takahashi, A. Sato, M. Takakura, N. Mori, J. Boerder, W. Knoll and J. Critchell 295
- Co-localization of copper, zinc and lead with calcium in their accumulation sites in the housefly’s abdomen by micro-PIXE.
G. Tylko, J. Borowska, Z. Banach, E. Pyza, W.J. Przybylowicz and J. Mesjasz‑Przybylowicz 301
- Micro-PIXE analysis of monazite from the Dora Maira Massif, Western Italian Alps.
G. Vaggelli, A. Borghi, R. Cossio, M. Fedi, L. Giuntini, B. Lombardo, A. Marino, M. Massi, F. Olmi and M. Petrelli 305
- A novel method of analytical transmission electron microscopy for measuring highly accurately segregation to special grain boundaries or planar surfaces.
T. Walther, A. Rečnik and N. Daneu 313
- In-situ investigation of discolouration processes between historic oil paint pigments.
R. White, M.R. Phillips, P. Thomas and R. Wuhrer 319
- Off-line metrology on SEM images using gray scale morphology.
E.N. Zois, I. Raptis and V. Anastassopoulos 323
