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PROCEEDINGS OF THE EMAS 2003 EUROPEAN WORKSHOP

8th European Workshop in Chiclana de la Frontera, Spain

Mikrochimica Acta, vol. 145, nos. 1-4, p. 1-279 (2004)

Mikrochimica Acta, vol. 147, no. 3, p. 125 - 186 (2004)

Edited by: X. Llovet, F. Salvat, C.T. Walker and G.F. Bastin

          This special issue of Mikrochimica Acta contains papers from the 8th Workshop of the European Microbeam Analysis Society (EMAS), on “Modern Developments and Applications in Microbeam Analysis”, which took place on May 18-22, 2003 at the Hotel Valentin Sancti Petri, Chiclana de la Frontera, Spain.

          The primary aim of the EMAS workshops is to assess the state of the art and current capabilities of microbeam analysis techniques. The workshops have a very distinct format, comprising a limited number of invited tutorial lectures by internationally recognised experts, poster presentations by the participants and round-table discussions on the key topics, lead by experts in the field and allowing direct participation of the audience. There are also special oral sessions for selected posters and for young scientists. Small cash prizes are awarded for the best poster and for the best oral presentation by a young scientist.   The EMAS workshops provide an excellent forum for students and young researchers, starting their career in microbeam analysis, to meet and discuss with the established experts.

          On this occasion, the scientific sessions covered topics from frontline theory ("Monte Carlo simulations"), instrumentation ("New detector technologies"), and emerging techniques ("Electron backscattered diffraction", "Low-vacuum SEM"), to everyday practice and applications ("Microbeam methods in the earth sciences", "Applications of microbeam analysis"). There were 181 participants, six round-table discussions and 104 poster presentations. Seventeen invited speakers, leaders in their respective fields, described the current state of the art in their area of expertise in 45-minute talks and participated in the round-table discussion following the talks. Thirteen companies took part in the commercial exhibition and 18 institutions and companies sponsored the event.

          Ivan De Ryck, from the University of Antwerp, received the prize for the best oral presentation by a young scientist for his talk entitled “Microanalytical study of corrosion products on ancient copper alloys containing arsenic and tin”.   The prize for the best poster went to Silvia Richter, from the RWTH Aachen, for her poster “Depth profile analysis on the nanometre scale by a combination of electron probe microanalysis and focused ion beam specimen preparation”.

          This proceedings volume contains the texts of 11 of the tutorial lectures and 43 papers originating from the posters presented at the workshop. The work of all the authors is deeply appreciated. All the contributions have been subjected to peer review by two referees, whose meticulous and valuable work is also gratefully acknowledged. The proceedings of all previous EMAS workshops were also published either as a special issue of Mikrochimica Acta or a supplement to the journal.   Undoubtedly, as with the others in the series, the present volume will become a key source of information for scientists and technicians using microbeam analysis techniques.

Table of contents – vol. 145, nos. 1-4

-  Examination of the plenum and deposition coupon of the Phebus FPT4 test by scanning electron microscopy and photoemission spectroscopy.

    P.D.W. Bottomley, T. Gouder, F. Huber, D. Papaioannou and D. Pellottiero         3

-   Thickness determination of ultra-thin films on Si substrates by EPMA.

    C.S. Campos, M.A.Z. Vasconcellos, X. Llovet and F. Salvat                   13

-   X-ray analysis of multi-films for electrochromic device application.

    H.-N. Cui, S. Jia, L.-J. Meng and V. Teixeira                                   19

-   Electron excited M X-ray spectra of the elements 55 = Z = 58.

    J. Dellith and M. Wendt                                                     25

-  From substrate to coating: micro- and surface analysis techniques for the development of steel products.

    R. Dillen, A. De Vyt, C. Xhoffer, E. Leunis, S. Claessens and A. Dhont      29

-   X-ray microanalysis of real materials using Monte Carlo simulations.

    R. Gauvin and E. Lifshin                                                41

-   Relaxation of alkali glass exposed to an electron beam.

    O. Gedeon and K. Jurek                                                  49

-  Characterisation of sugar cane combustion particles in the Araraquara Region, Southeast Brazil.

    R.H.M. Godoi, A.F.L. Godoi, A. Worobiec, S.J. Andrade, J. de Hoog, M.R. Santiago-Silva and R. Van Grieken                      53

-    Investigation of nickel-based alloys exposed to supercritical water environments.

    W. Habicht, N. Boukis, G. Franz and E. Dinjus                                      57

-  Composition modulation in low temperature growth of InGaAs/GaAs system: influence on plastic relaxation.

    M. Herrera, D. González, M. Ujúe González, Y. González, L. González and R. García                                         63

-  Comparison of dynamic simulations with RBS measurements of low energy ion implantation of Sb⁺ into SiO₂/Si substrates.

    V.A. Ignatova, U. Wätjen, I.V. Katardjiev and I.R. Chakarov                  67

-  Effect of different electron elastic-scattering cross-sections on inelastic mean free paths obtained from elastic-backscattering experiments.

    A. Jablonski, F. Salvat and C.J. Powell                                  75

-    Microcalorimeter detectors and low voltage SEM microanalysis.

    E.A. Kenik, D.C. Joy and D. Redfern                                   81

-    Investigation of contemporary forgeries of ancient silver coins.

    G. Kraft, S. Flege, F. Reiff and H.M. Ortner                         87

-   Detection of gas bubble by SIMS in irradiated nuclear fuel.

    J. Lamontagne, J. Noirot, L. Desgranges, T. Blay, B. Pasquet and I. Roure           91

-  Study on the chemistry and structure of (Na_(1-x)Bi_x)(Nb_(1-y)Mn_y)O₃ ceramics by XPS, AES and EPMA.

    K. Lawniczak-Jablónska, I.N. Demchenko, E. Piskorska, A. Molak, J. Kachniarz and M. Heinonen                                     95

-   Analytical electron microscopy in a discontinuous precipitated Cu-In alloy.

    G.A. López, P. Zieba, W. Gust and E.J. Mittemeijer                                  101

-    Characterization of interfacial reactions in Cu/In/Cu joints.

    L. Litynska, J. Wojewoda, P. Zieba, M. Faryna, W. Gust and E.J. Mittemeijer         107

-  Monte Carlo simulation of electron transport and X-ray generation. II. Radiative processes and examples in electron probe microanalysis.

    X. Llovet, F. Salvat and J.M. Fernández-Varea                                     111

-  Design and application of a set of vitreous standards for EDS-SEM microanalysis of melting shop slags.

    C. Luna, C. Lloreda, J.F. Almagro Bello, J. Botella, M.J. Orts and A. Gozalbo         121

-  Structural study of micro and nanotubes synthesized by rapid thermal chemical vapour deposition.

    F.M. Morales, D. Méndez, T. Ben, S. Ignacio Molina, D. Arajúo and R. García             129

-  Microstructure of nickel aluminides formed in situ in aluminium matrix composites.

    A. Olszówka-Myalska                                                 133

-  New SIMS procedures for the characterization of a complex silicate matrix, Na₃(REE,Th,Ca,U)Si₆O₁₅.2.5H₂O (Sazhinite), and comparison with EPMA and SREF results.

    L. Ottolini, F. Cámara and B. Devouard                                    139

-  Identification by electron probe microbeam analysis of submicron borides in joints of nickel base superalloys.

    C. Pascal, C. Merlet, R.-M. Marin-Ayral, J.-C. Tedenac and B. Boyer              147

-  Study of the microtexture of recrystallized aluminium.

    H. Paul                                                              153

-  Phase and element contents of the cBN based composites as estimated by XPS.

    E. Piskorska, K. Lawniczak-Jablónska, I.N. Demchenko, E. Benko and M. Heinonen                                       159

-  Crystalline inclusions formed in C + N + BF₂ coimplanted on silicon (111).

    A. Ponce, F.M. Morales, S.I. Molina, L. Barbadillo, M. Cervera, M.J. Hernández, P. Rodríguez and J. Piqueras                            165

-  Large-field EBSD mapping: application to the microstructure of a friction stir welding nugget.

    J.-L. Pouchou, D. Boivin, Y. Renollet and C. Gallais                171

-    Contribution of EBSD to the understanding of massive ? transformation in TiAl.

    J.-L. Pouchou, A. Denquin and A. Ferrini                                     177

-   EDS X-ray investigation of interdiffusion in Au-Ni micro- and nanolayers.

    A. Rakowska, R. Filipek, K. Sikorski, M. Danielewski and R. Bachorczyk           183

-  Depth profile analysis on the nanometer scale by a combination of electron probe microanalysis (EPMA) and focused ion beam specimen preparation (FIB).

    S. Richter, M. Bückins, A. Aretz, S. Kyrsta, M. Spähn and J. Mayer                    187

-  Monte Carlo simulation of electron transport and X-ray generation. I. Electron elastic and inelastic scattering.

    F. Salvat, X. Llovet and J.M. Fernández-Varea                                     193

-   An EPMA study on KNbO₃ and NaNbO₃ single crystals – potential reference materials for quantitative microanalysis.

    Z. Samardzija, S. Bernik, R.B. Marinenko, B. Malic and M. Ceh                      203

-   Certified reference materials for micro-analysis of carbon and nitrogen.

    S. Saunders, P. Karduck and W.G. Sloof                                   209

-  Strategy for applying microanalytical techniques.

    W.G. Sloof and L.P.H. Jeurgens                                      215

-  Chemical characterization of airborne particles in St. Martinus Cathedral in Weert, The Netherlands.

    Z. Spolnik, A. Worobiec, J. Injuk, D. Neilen, H. Schellen and R. Van Grieken         223

-   A check total for validating standardless and normalised EDX analysis at low kV.

    P.J. Statham                                                             229

-   SIMS analysis of uranium and actinides in microparticles of different origin.

    G. Tamborini                                                           237

-  Image formation in low vacuum SEM.

    B.L. Thiel                                                          243

-  Chemical investigation of coloured minerals in natural stones of commercial interest.

    G. Vaggelli, F. Olmi, M. Massi, L. Giuntini, M. Fedi, L. Fiora, R. Cossio and A. Borghi                                      249

-    Microchemical analysis and microstructural development of Cr-doped mullites.

    P. Pilar Villar, J.M. Geraldía, S.I. Molina and R. García                  255

-   M spectra of the rare earth elements measured with an ultra-thin window Si(Li) detector.

    M. Wendt and J. Dellith                                                 261

-  Misfit-dislocation induced surface morphology of InGaAs/GaAs heterostructures.

    O. Yastrubchak, T. Wosinski, E. Lusakowska, T. Figielski and A.L. Tóth      267

-  The corrected value of the Y La mass absorption coefficient in silicon.

    M. Zelechower, J. Grecka, J. Weszka and M. Kepinska                         271

-  Microchemical and microstructural characterization of the early stages of the discontinuous precipitation reaction in Al-22 at.% Zn alloy.

    P. Zieba and D.B. Williams                                            275

Table of contents – vol. 147, no. 3

-    Quantitative analysis of thin specimens in the TEM using a f(r)z-model.

    G. Boon and G.F. Bastin                                                125

-   Direct measurement of electron beam scattering in the low vacuum SEM.

    R. Belkorissat, A. Kadoun, M. Dupeyrat, B. Khelifa and C. Mathieu                135

-    Characterization of vacuum brazed joints for superconducting cavities.

    I. Calliari, E. Ramous, K. Brunelli, M. Dabalà, P. Favaron and D. Zambotto      141

-  Transmission electron microscopy study on the formation of Al₁₈B₄O₃₃ whiskers.

    I. Carazeanu, V. Ciupina, C. Guguta and G. Prodan                         147

-  High-resolution transmission electron microscopy study of LiNi_xCo_1-xO₂ synthesized by unconventional methods.

    V. Ciupina, I. Carazeanu, G. Prodan and C. Guguta                         151

-  The use of electron backscatter diffraction for the investigation of nano crystalline materials and the move towards orientation imaging in the TEM.

    D.J. Dingley and M.N. Nowell                                         157

-  Platinum-group element distribution in some ore deposits: results from EPMA and micro-PIXE analyses.

    F. Gervilla, L.J. Cabri, K. Kojonen, T. Oberthür, T. Weiser, B. Johanson, S.H. Sie, J.L. Campbell, W.J. Teesdale and J.H.G. Lflamme               167

-  Atomic force microscopy analysis of statistical roughness of GaAs surfaces originated by thermal oxidation.

    P. Klapetek, I. Ohlidal and K. Navrátil                                  175

-   TEM orientation mapping applied to the study of shear band formation.

    H. Paul, A. Morawiec, E. Bouzy, J.J. Fundenberger and A. Piatkowski           181