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PROCEEDINGS OF THE EMAS 2001 EUROPEAN WORKSHOP
7th European Workshop in Tampere, Finland
Mikrochimica Acta, vol. 138, nos. 3-4, p. 99-282 (2002)
Mikrochimica Acta, vol. 139, nos. 1-4, p. 1-205 (2002)
Edited by: E. Heikinheimo, C.T. Walker and A. Armigliato
This special issue of Mikrochimica Acta contains papers from the 7th Workshop of the European Microbeam Analysis Society (EMAS) on “Modern Developments and Applications in Microbeam Analysis”, which took place on May 6-10, 2001 in the Tampere Hall, Tampere, Finland.
The biannual EMAS workshops have grown into internationally recognised forums for evaluating the current state of development and for probing the potential directions of progress in microanalytical techniques. The format of the meetings is now well tried with a limited number of invited talks by eminent scientists and with round-table discussions allowing direct participation of the audience. In plain numbers in Tampere there were 175 participants, 18 tutorial lectures, four round-table discussions and 93 posters. Twenty-one companies participated in the commercial exhibition.
The main topics on electron probe microanalysis were: present status and future trends, utilisation of soft X-rays in both EDS and WDS, new detector technologies, analysis of thin films and coatings, application to thin films and coatings and EPMA in the earth sciences. The main topics on analytical electron microscopy were: imaging and analysis at atomic resolution and progress in X-ray detection, and in surface and scanning probe techniques: ultra-shallow depth profiling, scanning probe ion mass spectrometry, quantification in XPS and applications of XPS to fibre surfaces.
There was a special oral session for young scientists and the best poster and oral presentations were awarded. The best poster prize went to Olivier Arnould and François Hild from the University of Paris for “EDS measurements of diffusion profiles at the submicrometre scale”. Jens Lenaerts from the University of Antwerp received the prize for best oral presentation for his talk titled “Possibilities and limitations for organic dye detection at the surface of silver halide microcrystals with TOF-SIMS”.
This proceedings volume contains the full texts of 16 of the tutorial lectures and 32 papers on the topics covered at the meeting, originating from the poster contributions. The work of all the authors is deeply appreciated. The contributions have been subjected to peer review by two referees, whose meticulous and valuable work is also gratefully recognised.
This kind of meeting is always a joint effort of surprisingly many parties who contribute in different ways. Here we would especially like to acknowledge the role of the personnel of Tampere Hall and Tampere Convention Bureau, who cooperated in a very effective and friendly manner.
Table of contents – vol. 138, nos. 3-4
- The legacy of Raimond Castaing.
F. Grillon and J. Philibert 99
- Improving matrix corrections.
D.C. Joy 105
- EPMA present and future.
G. Love 115
- Applications of electron microbeam analysis in the earth sciences.
J.F.W. Bowles 125
- X-ray microanalysis of thin surface films and coatings.
J.-L. Pouchou 133
- Quantitative high-resolution electron microscopy.
D. Van Dyck 153
- Structural and chemical analysis of materials with high spatial resolution.
K. van Benthem, S. Krämer, W. Sigle and M. Rühle 181
- Nanometer-scale chemical surface analysis by scanning (tunnelling) atom probes.
P.F.A. Alkemade and N.N. Gribov 195
- Examples of quantification in XPS on 5f materials.
T. Gouder and L. Havela 207
- Monitoring fibre surfaces with XPS in papermaking processes.
L.-S. Johansson 217
- Analytical potential of EDS at low voltages.
E.D. Boyes 225
- Soft X-rays and low-voltage SEM in practice.
S. Kuypers 235
- Benefits of X-ray spectrum simulation at low energies.
P. Duncumb and P.J. Statham 249
- Design features of a high-resolution microcalorimeter EDX system.
J. Höhne, M. Bühler, R. von Hentig, T. Hertrich, U. Hess, K. Phelan, D. Wernicke, D. Redfern and J. Nicolosi 259
- Energy-dispersive X-ray spectrometry by microcalorimetry for the SEM.
D. Newbury, D. Wollman, S.W. Nam, G. Hilton, K. Irwin, J. Small and J. Martinis 265
- Chemical interactions by low-energy electron-induced X-ray emission spectroscopy, LEXES.
C. Bonnelle 275
Table of contents – vol. 139, nos. 1-4
- EPMA measurements of diffusion profiles at the submicrometre scale.
O. Arnould and F. Hild 3
- Cathodoluminescence depth profiling in SiO2:Ge layers.
T. Barfels, B. Schmidt, A. Von Czarnowski and H.-J. Fitting 11
- EPMA major and trace element analysis in garnet and its petrological application.
A. Borghi, R. Cossio, F. Olmi, R. Ruffini and G. Vaggelli 17
- EPMA and X-ray diffraction of the degraded fuel bundle from the Phebus FPT1 test.
P.D.W. Bottomley, S. Brémier, D. Papaioannou and C.T. Walker 27
- A HREM and analytical STEM study of precipitates in an AZ91 magnesium alloy.
J. Bursík and M. Svoboda 39
- Analysis of laser irradiated organo-platinum films.
M.R. Davidson, Y. Fan, G.J. Berry, J.A. Cairns and A.G. Fitzgerald 43
- Thermal decomposition studies of organoplatinum films.
Y. Fan, M.R. Davidson, J.A. Cairns, G.J. Berry and A.G. Fitzgerald 49
- Crystal orientation mapping applied to the Y-TZP/WC composite.
M. Farina, E. Bischoff and K. Sztwiertnia 55
- Microanalytical techniques applied to phase identification and measurement of solute redistribution at the solid/liquid interface of frozen Fe-4.3Ni doublets.
M. Faryna, W. Wolczynski and T. Okane 61
- Decay curve analysis of alkali-silicate glass exposed to electrons.
O. Gedeon and K. Jurek 67
- Analysis of early medieval glass beads – The raw materials to produce green, orange and brown colours.
M. Heck and P. Hoffmann 71
- Observation of Sb2O3 nanocrystals in SiO2 after Sb implantation.
V.A. Ignatova, O.I. Lebedev, A. Wätjen, L. Van Vaeck, J. Van Landuyt, R. Gijbels and F. Adams 77
- Determination of Nb, Ta, Zr and Hf in micro-phases at low concentrations by EPMA.
F. Kalfoun, C. Merlet and D. Ionov 83
- Effect of oxide coverage on the growth of amorphous Al2Pt phase on an Al surface.
A. Kovács and P.B. Barna 93
- Microstructural evolution of titanium carbonitride based materials during oxidation.
F. Monteverde, V. Medri and A. Bellosi 97
- Determination of nitrogen in duplex stainless steels by EPMA.
I. Moreno, J.F. Almagro and X. Llovet 105
- Application of thin-window EPMA to environmental problems in Hungary.
J. Osán, S. Kurunczi, S. Török, A. Worobiec and R. Van Grieken 111
- Interface of an Al-(Al2O3)p composite modified with nickel.
A. Olszówska-Myalska 119
- Quantification of H, B and F in kornerupine: accuracy of SIMS and SREF (X-ray single-crystal structure refinement) data.
L. Ottolini, F. Cámara and F.C. Hawthorne 125
- New experimental cross-section measurement for Cr and Cu and comparison with model predictions.
S. Ouziane and A. Amokrane 131
- 3D reconstruction of rough surfaces by SEM stereo imaging.
J.-L. Pouchou, D. Boivin, P. Beauchêne, G. Le Besnarais and F. Vignon 135
- Analytical electron microscopy of a magnesium alloy containing neodymium.
A. Rakowska, M. Socjusz-Podosek, L. Litynska and R. Ciach 145
- Volcanic quartz growth zoning identified by cathodoluminescence and EPMA studies.
R. Ruffini, A. Borghi, R. Cossio, F. Olmi and G. Vaggelli 151
- Quantitative WDXS microanalysis of bismuth-based BaBi4Ti4O15 perovskites doped with Nb and Fe.
J. Samardzija, D. Makovec and M. Ceh 159
- Study of thin oxide films by electron, ion and synchrotron radiation beams.
V. Sammelselg, E. Rauhala, K. Arstila, A. Zakharov, J. Aarik, A. Kikas, J. Karlis, A. Tarre, A. Seppälä, J. Asari and I. Martinson 165
- Particle analysis by SEM/EDXS and specimen damage.
M. Schmied and P. Pölt 171
- X-ray emission from thin films on a substrate – calculation and experiments.
V. Stary and K. Jurek 179
- Development of a SIMS method for isotopic measurements in nuclear forensic applications.
G. Tamborini, M. Wallenius, O. Bildstein, L. Pajo and M. Betti 185
- Indirect measurement of biologically important compounds by means of X-ray microanalysis.
G. Tylko, W.M. Kilarski and M. Mikrut 189
- M spectra of elements 39 = Z = 56 measured with an ultra-thin window Si(Li) detector.
M. Wendt 195
- Oxidation of steels and HgO growth after 5000 hours exposure in mercury at 573 K.
R.K. Zalavutdinov, Y. Dai, A.E. Gorodetsky, G.S. Bauer, V.K. Alimov and A.P. Zakharov 201
