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PROCEEDINGS OF THE EMAS '97 EUROPEAN WORKSHOP
5th European Workshop in Torquay, United Kingdom
Mikrochimica Acta, Supplement 15, 392 p. (1998)
Edited by: G. Love, W.A.P. Nicholson and A. Armigliato
Supplement no. 15 to Mikrochimica Acta contains selected papers from the 5th EMAS Workshop on "Modern Developments and Applications in Microbeam Analysis", which took place from the 11th to 15th May 1997 in Torquay (Great Britain). For this meeting EMAS chose to invite speakers on the following subjects: Standardless analysis, EPMA techniques for quantitative near-surface analysis and depth profiling, matrix corrections in Auger electron and X-ray photoelectron spectroscopy, X-ray analysis and imaging using low-voltage beams, Scanning probe and near-field microscopies, Quantitative elemental mapping of X-ray radiographs by factorial correspondence, X-ray spectrum processing and multivariate analysis, Thin film analysis and chemical mapping in the analytical electron microscope, wavelength-dispersive X-ray spectroscopy, High-resolution non-dispersive X-ray spectroscopy with state-of-the-art silicon detectors, and Recent developments in instrumentation for X-ray analysis. These invited lectures were given by eminent scientists from Europe, the U.S.A. and Australia. In addition to the plenary lectures, there were poster sessions at which some 110 posters were on display.
The issue contains the full texts of ten tutorial lectures and forty-one papers originating from the posters presented at the workshop. All the contributions were subjected to peer review by two referees. The papers presented in this volume have been divided into the following subjects:
- X-ray spectrometry
- Analytical electron microscopy - Thin films
- Surface studies - Coatings - Multilayers
- Bulk analysis - Materials applications - Mineralogical applications
- Biological applications including environmental SEM
- Fundamental parameters - Quantitative analysis
- Miscellaneous papers.
Table of contents
Recent developments in instrumentation for X-ray microanalysis. P.J. Statham 1
High-resolution non-dispersive X-ray spectroscopy with state-of-the-art silicon detectors. L. Strüder, C. Fiorini, E. Gatti, R. Hartmann, P. Holl, N. Krause, P. Lechner, A. Longini, G. Lutz, J. Kemmer, N. Meidlinger, M. Popp, H. Soltau and C. von Zanthier 11
Efficiency calibration of a Si(Li) detector by EPMA. K. Röhrbacher, M. Andrae, M. Völkerer and J. Wernisch 21
Wavelength-dispersive X-ray spectrometry. S.J.B. Reed 29
X-ray spectrum processing and multivariate analysis. J.M. Titchmarsh 37
Thin film analysis and chemical mapping in the analytical electron microscope. D.B. Williams, M. Watanabe and D.T. Carpenter 49
On the spatial resolution in analytical electron microscopy. A. Armigliato, D.J. Howard, R. Balboni, S. Frabboni and M.R. Caymax 59
Contamination in analytical electron microscopy and in ALCHEMI. J.L. Lábár, M. Adamik and I Dódony 65
Analytical electron microscopy of diffusional interfaces in an Al - 22 at.% Zn alloy. P. Zieba 73
Quantitative TEM-EDX of sol-gel derived PZT ceramic materials. G. Drazic, B. Malic and M. Kosec 77
Particulate composites of TZP-chromium oxide and TZP-chromium carbide; microbeam investigations. M. Faryna, L. Litynska, K. Haberko, Z. Pedzich and J. Babiarz 83
Cryo-electron spectroscopic imaging, electron energy-loss spectroscopy and energy-dispersive X-ray analysis of Ag(Br,I) nano- and microcrystals. V.P. Oleshko, R.H. Gijbels, W.A. Jacob and A.J. Van Daele 87
Electron energy-loss near-edge structure of alumina polymorphs. I. Levin, A. Berner, C. Scheu, H. Muellejans and D.G. Brandon 93
SPM study of YBCO films prepared by plasma assisted laser ablation. Y. Fan, A.G. Fitzgerald and H. Xu 97
Surface characterisation and modification of YBCO thin films by STM. A.G. Fitzgerald, Y. Fan and H. Xu 101
Quantitative near-surface microanalysis and depth profiling by EPMA. P. Karduck 109
EPMA sputter depth profiling, part I: Theory and evaluation. S. Richter, N. Lesch and P. Karduck 125
EPMA sputter depth profiling, Part II: Experiment. N. Lesch, S. Richter and P. Karduck 133
Quantitative analysis of BN (C,O,Ar,H)-coatings using EPMA and SIMS. P. Willich and U. Wischmann 141
Quantitative EDS analysis of SiO2/Al2O3/TiO2 multilayer films. D.G. Rickerby, N. Wächter and R. Reichelt 149
Surface ionisation of thin films on substrates: measurement and simulation. X. Llovet, C. Merlet and F. Salvat 155
Comparison of different methods to characterise thin a-Si:H films. H.G. Esser, P. Karduck, M. Rubel, N. Almqvist, L. Grobusch, J. von Seggern, F. Weschenfelder and P. Wienhold 163
EPMA studies of the growth of thin surface coatings produced by evaporation. H. Hammer, S. Kulow, C. Schmidt, G. Schmidt and P. Zanel 171
Analysis of thin films with slightly rough boundaries I. Ohlídal, D. Franta, J. Hora, K. Navrátil, J. Weber and P. Janda 177
Effect of chromium substrate pre-treatment on diamond growth by the chemical vapour deposition method. O. Glozman, A. Berner, D. Schechtman and A. Hoffman 181
EPMA determination of arsenic excess in low-temperature grown GaAs. V.V. Chaldyshev and V.V. Tretyakov 187
EPMA of melted UO2 fuel rods from the Phebus-FP reactor accident experiment. P.D.W. Bottomley, F. Montigny, A.D. Stalios and C.T. Walker 191
Steels, carbon concentration, and microhardness. P. Poelt and A. Fian 201
Determination of chemical and phase composition of fly-ashes by combined EPMA and XRD methods. M. Zelechower, D. Smolka, M. Jablonska and A. Dytkowicz 207
EPMA of the composition of opal-based nanostructured materials. V.V. Tretyakov, S.G. Romanov, A.V. Fokin and V.I. Alperovich 211
NDIC and EMP study of plagioclase mineral zoning: an example from Nea Kameni lavas. A.P. Santo and R.M. Bomparola 219
Compositional X-ray maps of metamorphic and magmatic minerals. A. Borghi, R. Cossio, F. Olmi and G. Vaggelli 227
Chemical mapping of weathering stages in laterites. W. Hachmann and G. Tietz 237
Electron microprobe determination of minor and trace concentrations of gold and platinum group elements in sulphides and sulpharsenides: problems, solutions, and applications. I.P. Laputina and V.A. Batyrev 247
Composition of 15-17th century archaeological glass vessels excavated in Antwerp, Belgium. K.H. Janssens, I. De Raedt, O. Schalm and J. Veeckman 253
Potassium migration in silica glass during electron beam irradiation. K. Jurek, O. Gedeon and V. Hulínský 269
X-ray microanalysis of frozen-hydrated biological bulk samples. A.T. Marshall 273
Environmental SEM and X-ray microanalysis of biological materials. D.C. Sigee 283
Effects of electron-beam / gas interactions on X-ray microanalysis in the variable pressure SEM. C. Mathieu 295
The analytical signal in EPMA and the influence of the electric field created by the primary beam. O. Gedeon, V. Hulínský and K. Jurek 301
Standardless analysis. J. Wernisch and K. Röhrbacher 307
A new technique for standardless analysis by EPMA-TWIX. M. Völkerer, M. Andrae, K. Röhrbacher and J. Wernisch 317
Stopping power factor for standardless QEPMA. B.I. Losic and F.A. Tabak 321
On the measurement of the backscattering coefficient for low-energy electrons. M.M. El-Gomati and A.M.D. Assa'd 325
Monte Carlo simulations of edge artefacts in MULSAM images. M.M El-Gomati and A.M.D. Assa'd 333
Assessment of the inelastic scattering model in Monte Carlo simulations. V. Starý 341
A rapid comparison of matrix corrections in AES and XPS by means of computer programmes. A.G. Fitzgerald 351
Fractals and BaTiO3-ceramic microstructure analysis. V.V. Mitic, L.M. Kosic, M. Miljkovic and I. Petkovic 365
Fragmentation of sputtered cluster ions of transition metals: distributions of lifetimes and internal energies. A.D. Bekkerman, N.K. Dzhemilev, S.V. Verkhoturov, I.V. Veryovkin and A. Adriaens 371
Sputtering of tantalum by atomic and molecular gold ions: comparative study of yields and kinetic energy distributions of atomic and cluster ions. S.F. Belykh, U.K. Rasulev, A.V. Samartsev, S.V. Verkhoturov and I.V. Veryovkin 379
The Standards, Measurements and Testing programme (SMT), the European support to standardisation, measurement and testing projects. A. Boenke 387
