SI and Phase Mapping   2017

Course Leader: Hans Djikstra (NL)

First run: Konstanz European Workshop, 2017

Advanced Spectral Imaging, Mapping and Phase Mapping
In this ½-day short course, we will take a close look at EDS beyond regular X-ray spectroscopy. Modern techniques for analysing inhomogeneous specimens will be discussed and demonstrated. This course will consist of lectures on the fundamentals of the technique, practical recommendations on the acquisition and processing of large volumes of X-ray data, and discussions on the applicability of the technique to a wide variety of materials. Interested participants are encouraged to bring their own laptop to have spectral imaging software installed and experiment with processing several spectral imaging datasets themselves