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MAS Topical Conference: QMA 2019
From 24.06.2019 until 27.06.2019 Save to calendar
Quantitative Microanalysis 2019 is an MAS Topical Conference (TC), to be held at the University of Minnesota, Minneapolis. This TC is the second of its kind, and is built on the success of the TC “EPMA 2016”.
The TC will be a plenary meeting with user meetings on Monday June 24,followed by three days of technical talks, and will include tutorials on microanalysis by EPMA-WDS and SEM-EDS, invited talks by leaders in the field of microanalysis, group sessions, laboratory remote demonstrations, poster sessions, and group meals.
QMA 2019 is focussed on the group educational experience for beginners to experts. We encourage attendees from academic, government, industry, and the vendor communities. The following key topics are suggested:
1) General EPMA
* Matrix correction: ZAF versus Phi-Rho-Z, mass absorption coefficients, with examples of applications (e.g., light element analysis, Si in heavy matrix).
* Standards and standard database: Assessing the current state and determining the need for the future, the making or collecting of standard materials.
* Instrument quality control, calibration and standardisation: How much and how often (WDS versus EDS/SDD).
2) WDS and quantitative microanalysis
* WDS techniques: Sample preparation, setup preparation, determination of the appropriate analytical conditions.
* Peak interference correction: procedure and importance, application to complex matrixes (e.g., REE analysis, transition metals, trace elements).
* Experimentally measured calibration curves: How to use them to refine our choice of correction procedures.
* High-resolution analysis in FE-EPMA and SEM, challenges and solutions for low voltage analysis.
3) EDS analysis
* Good use of EDS: standard-based versus standardless analyses, EDS simulations.
* Combined EDS-WDS analysis applied to element mapping and quantitative analysis.
* Attainable precision and accuracy using WDS, EDS/SDD, or X-ray mapping and line-scans: major versus minor versus trace elements.
4) Quantitative analysis
* Trace element analysis and WDS background methods (two-points, linear, exponential, mean atomic number correction, multipoint background correction); the
importance of accurate background for trace element analysis; determining the optimum conditions for precise and accurate trace element analysis.
* Analysis of beam sensitive materials (glass, alkali-rich, hydrated and carbonated phases): speed versus dose versus size.
* Thin film and micro- to nano-phase analysis: inclusion, particles, layers: best strategies and choice of analysis conditions.
* Quantitative X-ray element mapping.
5) Hardware and software development for quantitative microanalysis
* Penelope, Monte Carlo and other simulations (interaction volume, secondary fluorescence): How good is the agreement between simulation data and experimentally measured data?
* New hardware developments such as heating stages, cold stages, detector electronics for the electron microprobe and SEMs. Also SXES, xCLent, hybrid X-ray focusing optics etc.