Course Leaders: Stuart Kearns (GB), Mike Matthews (GB)
First Run: Trondheim European Workshop, 2019
Introduction to quantitative EDS X-ray microanalysis
This half-day course is aimed at new users to X-ray microanalysis in the SEM utilising the energy-dispersive X-ray detector (EDS). We will overview the generation of X-rays under electron beam bombardment, review the factors controlling emission of those X-rays and consider the performance characteristics of the EDS and discuss the benefits and limitations of the resulting energy-dispersive spectrum. We will then apply EDS to the acquisition of quantitative analysis of materials (including a consideration of standards-based analysis and standardless analysis) and mapping and phase identification in unknown samples.